JEOL USA Press Releases

October 28, 2008 – Peabody, Massachusetts – Electron microscope leader JEOL USA hosted a special visit recently from renowned materials scientist Dr. Akihisa Inoue, President of Tohoku University in Sendai, Japan. Dr. Inoue’s research in a new class of bulk amorphous metals has made a major impact on subsequent research into new materials around the world. U.S. Honors Dr. Inoue with Two Awards Dr. Inoue has recently received distinction as one of only nine foreign associates ...

October 29, 2008 – Peabody, Mass. - First it was pets, now it is babies who have died from ingesting food tainted with melamine. Detection of this chemical compound, which is being maliciously added to food products to make them appear to contain higher levels of protein, takes on a new urgency in a global market. A rapid screening technique that has been widely used for instant analysis without sample preparation has just been proven ...

Peabody, Mass., October 15, 2008 – Two of JEOL’s top-of-the-line cryo-electron microscopes will be key instrumentation for multi-disciplinary scientific advances in a new $1 billion research center in Kannapolis, North Carolina. The David H. Murdock Research Institute (DHMRI) has selected JEOL’s high resolution electron microscopes for its world-class laboratory, which will serve as a central resource to multiple university research institutes and private companies. The vision and impetus behind this collaborative research institute is that ...

“Shaping the technology of tomorrow” is the maxim of the College of Engineering at the University of Texas San Antonio, but shaping the scientists and engineers of the future is the mission of the college’s interactive Technology Experience Center (iTEC). A unique learning center that integrates technology with fun to captivate the interest of young children, iTEC is holding a series of open houses this fall for students ranging from kindergarten to high school age. ...

July 30, 2008 (Peabody, Mass.) -- From the exhibition hall at the 2008 Microscopy and Microanalysis Conference in Albuquerque, New Mexico, JEOL USA will demonstrate – via remote operation – three of its more than 30 JEOL TEMs currently using Sirius™ Remote TEM software and internet or wireless connections. Visitors to the booth will be able to perform real-time operation of the JEM-2200FS Aberration-corrected TEMs at Oak Ridge National Laboratory in Tennessee and Lehigh ...

July 31, 2008 (Peabody, Mass.) -- JEOL USA will demonstrate a new high throughput Thermal Field Emission (FEG) Scanning Electron Microscope (SEM), the JSM-7600F, at M&M 2008 in Albuquerque, New Mexico in its booth #1027. Featuring the highest beam current available on any FEG SEM, the JSM-7600F integrates a semi-in-lens objective lens with an in-lens thermal electron gun, providing superior imaging of nonconductive samples that traditionally charge, such as photomasks, ceramics, and glass. This ...

July 30, 2008 (Peabody, Mass.) -- JEOL USA will demonstrate both of its new MultiBeam SEM/FIB instruments in a special exhibit area dedicated to its ion beam “power tools” at M&M 2008. The LaB6 model, the JIB-4500 MultiBeam, was introduced in December 2007 and has already gained wide acceptance, with recent installations at nanotechnology research centers at Boston College and the University of Southern California. A new Field Emission MultiBeam, the model JIB-4600F, will debut ...

July 28, 2008 (Peabody, Mass.) -- JEOL USA will host a tutorial session at M&M 2008 in conjunction with Oak Ridge National Laboratory (ORNL) and Protochips to introduce PRISM – Practical Remote In Situ Microscopy. The PRISM tutorial will be held on Monday, August 4, 2008 at the Microscopy & Microanalysis (M&M) Exhibit in Albuquerque, New Mexico in the JEOL booth #1027 at 5:30 p.m. PRISM is a technique made possible by the remote operation ...

July 28, 2008 (Peabody, MA) -- JEOL, the global leader in electron microscopy for nearly 60 years, will demonstrate a variety of new software packages for its 120kV to 300kV series of Transmission Electron Microscopes (TEMs) in booth #1027 at the M&M 2008 Microscopy and Microanalysis exhibit in Albuquerque, New Mexico from August 4-7. Exploring the frontiers of electron microscopy, scientists using JEOL TEMs accelerate research advances and boost productivity with a suite of recently ...

See the new JEOL lineup: Power Tools for Microscopy and Sample Processing