JEOLink Newsletter

• Introducing the JEM-Z200MF: A Revolutionary Magnetic Field-Free Atomic Resolution Imaging System
• Join Us for Precision in 2D: A Cutting-Edge Symposium on 2D & Topological Materials
• Image Contest Winners
• Fall Giving: Community Service in Action
• Battery Forum Session: How to Look inside your LIB with SEM
• Featured Research: New Insights into Roco Protein Activation Mechanism
• First AC-S/TEM in Oklahoma
• AutoEM Platform Wins Prestigious Licensing Award
• JEOL USA Recognized as Sustaining MSA Member
• Application Spotlight: Life Sciences

• JEM-120i Wins the Instrument Business Outlook's 2024 Silver Design Award
• Cryo-EM Webinar - Exploring the Range of Electron Microscopes: Resolution, Size and Users
• First U.S. Installation of XtaLAB Synergy-ED
• New FE-SEM: JSM-IT810
• The Battery Show 2024
• IDES TEMPO featured in Science Magazine
• Why Use EDS Analysis for Li-Ion Batteries?

• New CRYO FIB-SEM
• Studying Viruses at the Center for Biologic Imaging at the University of Pittsburgh
• Real-time in situ charge/discharge for Lithium-ion Batteries
• Cryo-EM Webinar and Applications Notes
• Visualizing Elemental Distributions with SEM-EDS Mapping
• New in-situ SEM-Raman Capability

• JEOL Image Contest
• Microscopy at LSSU - Investigating Fresh Water Sponges and Particulate Contamination in Hemp
• Webinar: Visualizing Biomolecules with High-Throughput Single Particle Analysis
• Particle Contamination Inspection System for Battery Materials
• Focus in Pharmaceuticals: NeoScope Benchtop SEM
• Introduction to Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy for Advancing Materials Research
• Featured Papers and Microscopy News