ElementEye JSX-1000S XRF

Energy Dispersive X-ray Fluorescence Spectrometer

ElementEye JSX-1000S XRF

An easy-to-use, smart solution for high-sensitivity elemental analysis, this benchtop ED-XRF spectrometer analyzes major to trace components on most sample types - solids, powders, liquids - with little or no sample preparation. The ElementEye easily complements SEM, EPMA, NMR, and mass spectrometry analyses when needed.

The ElementEye is capable of 50kV excitation and features our newest silicon drift detector (SDD) technology. Coupled with JEOL's advanced Fundamental Parameters (FP) method, this instrument provides high-sensitivity qualitative and quantitative analysis results in minutes. Thin Film FP method is optionally available for non-destructive measurement of film thickness on coated samples.

High-sensitivity analysis can be performed across the entire energy range using a maximum of 9 types of filters and a sample chamber vacuum unit.

An optional 12-position auto sample changer speeds analysis with continuous acquisition.

Key Features

  • Touch screen operation
  • Pre-recorded recipes for standard solution applications: RoHS, Metals (Air/Vacuum *), Oxides (Air/Vacuum *), Organic Materials (Air/Vacuum *)
  • High-sensitivity SDD and short-path optical system for high throughput analysis
  • Advanced Fundamental Parameter (FP) methods for accurate quantification without standard samples. 
  • Residual balance and thickness correction for organic samples
  • XRF data can be imported into and integrated with EPMA Software
* Optionally available

Simple Operation

Simply set the sample and touch the screen; that’s how easy it is to operate. Another touch of the screen is all it takes to switch between analysis results and spectrum display. It is as easy to operate as a tablet PC or a smart phone. (Operation using a keyboard and a mouse is also supported.)
A simple, intuitive operation GUI

High Sensitivity & High Throughput

JEOL’s own SDD (silicon drift detector) and newly-developed optical system, in combination with filters designed to handle the entire energy range, make it possible to achieve high-sensitivity analysis. The sample chamber vacuum unit (option) further increases detection sensitivity for lighter elements. 
JSX-1000S Optical System

Sensitive analysis throughout the entire energy range

High-sensitivity analysis can be performed across the entire energy range using a maximum of 9 types of filters and a sample chamber vacuum unit.
Element correspondence with each filter and sample chamber vacuum unit
Element correspondence with each filter and sample chamber vacuum unit. Cl, Cu, Mo and Sb are options.
Example: trace element detection (10 ppm or less)
Example: trace element detection (10 ppm or less)

Providing Solutions

With solution based applications, the desired analysis can be executed automatically according to pre-recorded recipes. Simply select the desired solution icon from the solution application list for automated analysis and display of results. Solution applications offer simplified analysis in a wide range of fields.
The new Smart FP (Fundamental Parameter) method makes it possible to obtain highly-accurate quantitative results without the need to prepare a standard sample, and includes automatic correction for thickness and residual ingredient balance.
Note: the residual balance correction and thickness correction functions are only applicable to organic samples.
Thickness Correction Cr Zn Cd Pb Automatic balance
0.5mm No 0.008 0.037 0.001 0.002 99.76
3.8mm 0.012 0.109 0.004 0.006 99.64
0.5mm Yes 0.011 0.137 0.015 0.010 99.54
3.8mm 0.011 0.134 0.016 0.011 99.55
Standard value 0.010 0.125 0.014 0.010
Options:
  • Chamber Vacuum Unit
  • 12-Position Auto Sample Changer
  • Filter Set
  • Software Solutions:
    Filter FP method, Thin Film FP method, Ni plating screening, Sn plating screening, Halogen screening, Sum peak removal

Specifications

ElementEye JSX-1000S XRF specifications

Videos

Watch the video Introduction to JEOL ElementEye Benchtop ED-XRF

Application Notes

File 
Analysis of Cracks in Brass Piping Parts.pdf Download
Analysis with Separation of As and Pb in Iron and Steel.pdf Download
Emerging SEM Technology.pdf Download
Film Thickness by Thin Film FP Method.pdf Download
Plating Analysis - Collaboration of SEM and XRF.pdf Download
Qualitative and Quantitative Analysis of Metal Alloys by FP Method.pdf Download
Quantitative and Qualitative Analysis of Inorganic Elements in Plastic by FP Method.pdf Download
Quantitative and Qualitative Analysis of Oxides using the FP Method.pdf Download
Quick and Easy Analysis Solution - Soil Screening.pdf Download
X-Ray Fluorescence Helps Identify Peaks in DART Mass Spectrum of Electrical Tape - ElementEye JSX-1000S and AccuTOF-DART.pdf Download

Request ElementEye JSX-1000S XRF Product Info / Virtual Demo

Loading
  • Product / Page of Inquiry: ElementEye JSX-1000S XRF

  • By completing and submitting this form, you agree to the JEOL USA, Inc. Privacy Policy, and that your information may be shared with JEOL USA, Inc. and other JEOL affiliates.

© Copyright 2024 by JEOL USA, Inc.
  • Contact your local Sales Representative to schedule a
    virtual demo now (USA, Canada, Mexico, Brazil)
Terms of Use
|
Privacy Policy
|
Cookie Preferences