Full-Scale Scanning Electron Microscopes (SEM) – from Macro to Nano

From our most powerful flagship Field Emission SEM with the ultimate resolution, magnification, and analytical flexibility, to our easy-to-use entry level Benchtop SEM, JEOL offers a wide choice of SEMs to suit all applications. 
JEOL introduced its first Scanning Electron Microscope (SEM) in the early 1960s. Since then, JEOL innovations in resolution and SEM functionality have enabled microscopists to image and characterize a new generation of nanomaterials, reveal intricate biological details, analyze forensic evidence, and perform failure analysis and quality control. 
JEOL provides valuable applications support, comprehensive training, and award-winning service for our instruments.

Instruments:

InTouchScope™ SEMs

InTouchScope™ Field Emission SEM

JSM-IT710HR

JSM-IT710HR
High resolution, large chamber FE SEM. Compact, versatile Field Emission SEM that offers Smart-Flexible-Powerful performance at a great value.
InTouchScope™ SEM

JSM-IT510

JSM-IT510
Versatile research grade SEM.
InTouchScope™ SEM

JSM-IT210

JSM-IT210 InTouchScope™
Seamless navigation, high throughput SEM.

Field Emission SEMs

UHR Field Emission SEM

JSM-IT810

JSM-IT810
Ultrahigh resolution FE SEM with the most advanced high-resolution analytical technology available today.
InTouchScope™ Field Emission SEM

JSM-IT710HR

JSM-IT710HR
High resolution, large chamber FE SEM. Compact, versatile Field Emission SEM that offers Smart-Flexible-Powerful performance at a great value.

Learn more about our new generation of Field Emission SEMs

Benchtop SEM

Benchtop SEM

NeoScope™

JSM-IT710HR
Incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes.

SEM Options

SEM

miXcroscopy™

miXcroscopy™
Linked optical & scanning electron microscopy system. The same specimen holder can now be used for both the optical microscope and the scanning electron microscope.
SEM

SMILE VIEW™ Map

SMILE VIEW™ Map
SMILE VIEW™ Map software gives users access to an extensive set of tools for visualizing, analyzing and reporting on their data.
SEM

Neo Comfort

Neo Comfort
The FE-SEM acoustic enclosure enhances imaging performance in room environments that are not ideal. Examples include interference from: noise, airflow changes, magnetic disturbance, and vibrations.

Analytical Optimization

Elemental Analysis

SXES

Soft X-ray Emission Spectrometer
Soft X-ray emission spectrometer that utilizes a variable space grating, allowing the efficient and parallel collection of very low energy-rays (so called “soft” X-rays).
Analytical Optimization

Gather-X Windowless EDS

Soft X-ray Emission Spectrometer
Higher sensitivity and low-energy X-ray detection down to lithium.
Analytical Optimization

Embedded EDS for SEM

Embedded EDS for SEM
From our benchtop SEM to our highest-resolution FE SEM, we offer an EDS spectrometer designed by JEOL exclusively for each model of JEOL Scanning Electron Microscope.

Sample Prep

Sample Prep

Cross Section Polisher

Cross Section Polisher (CP)
Easy-to-use, sample preparation device for SEM, EPMA, and SAM applications. Broad ion beam polishing using the JEOL cross-section polisher (CP) offers pristine surface preparation with minimal artifacts.
Sample Prep

Cooling CP

Cooling CP
For preparation and polishing of materials that are sensitive to thermal damage. Temperature control down to -120°C.
Sample Prep

Excimer UV Cleaner

UV Cleaner
Mitigates contamination during observations made with an electron microscope, cleans specimens and tools, and hydrophilizes the specimen surface.
Sample Prep

Auto Fine Coater

Auto Fine Coater
Simple to use sputter coater that applies a fine grain Pt coating. Fully automated vacuum and coating.
Sample Prep

Carbon Coater

Carbon Coater
Thin film conductive coating for SEM imaging. This simple to use carbon coater features fully automated vacuum and carbon evaporation.
Sample Prep

Smart Coater

Smart Coater
Simple-to-use sputter coater with fully automated vacuum and sputtering.

Applications:

Please see our list of applications specific to Scanning Electron Microscopy.
© Copyright 2025 by JEOL USA, Inc.
  • Contact your local Sales Representative to schedule a
    virtual demo now (USA, Canada, Mexico, Brazil)
Terms of Use
|
Privacy Policy
|
Cookie Preferences