JEOL USA Transmission Electron Microscopes

JEOL is a world leader in the development and manufacture of leading edge, high performance, high stability Transmission Electron Microscopes (TEM). JEOL introduced its first TEM over 70 years ago and has been developing and producing TEMs designed for life sciences and material sciences ever since.

JEOL innovations in TEM/STEM technology range from extreme ultrahigh-resolution optics that enable atom-to-atom imaging and single particle analysis, as well as analytical characterization to the picometer level.

Scroll down for our complete product listing by application, or click to go directly to analytical techniques and TEM-related areas of interest.

Imaging and Cryomicroscopy Excellence in a Compact and Easy to Use 120kV TEM

Multipurpose 200kV LaB6 TEM that provides solutions for a wide range of applications from materials science to medical/biological studies, all at a low cost of ownership.

Advanced analytical, high throughput 200kV S/TEM with Cold Field Emission Gun and dual Silicon Drift Detectors

Automatic acquisition of image data for Single Particle Analysis - 200kV

Specializes in the observation of electron beam-sensitive specimens, such as protein, for single particle analysis, tomography and MicroED - 300kV

Imaging and Cryomicroscopy Excellence in a Compact and Easy to Use 120kV TEM

Multipurpose 200kV LaB6 TEM that provides solutions for a wide range of applications from materials science to medical/biological studies, all at a low cost of ownership.

Advanced analytical, high throughput 200kV S/TEM with Cold Field Emission Gun and dual Silicon Drift Detectors

World's Highest Resolution in a Commercially-Available TEM - 300kV

Atomic Resolution TEM with (Cold-FEG) and next-generation Cs corrector (ASCOR)

Ultrahigh energy resolution EELS analysis of materials at the atomic scale

A Revolutionary Magnetic Field-Free Atomic Resolution Imaging System

Automated, high-throughput S/TEM designed to meet the unique demands of semiconductor device development and manufacturing.

Add time resolution to the TEM's exceptional spatial resolution enabling new applications and the exploration of the dynamics of specimens across a range of very fast time scales.

High-sensitivity, low-noise 19 M pixel CMOS sensor enables clearer imaging with fine specimen details observable even at low electron doses.

The high-strength SiN film enables us to observe a serially large area of a millimeter in size. It is also ideal for observation of serially sliced sections because there is no invisible area that is caused by conventional TEM grids.