JEOL USA Blog

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accurate mass AccuTOF-DART Additive Manufacturing Aerospace ambient ionization Analysis atmospheric pressure interface Batteries Chromatography CID collision-induced dissociation cone voltage Cryo-EM DART DART-MS Deformulation Direct Analysis in Real Time direct write double bond equivalents ebeam EDS Electron Beam Powder Bed Fusion elemental composition even-electron ions fragment ions fragmentation GC-Alpha GC-HRTOFMS GC-MS/MS GCxGC-HRTOFMS General Gulf Coast Conference Image Contest in-source CID isomers isotope measurements isotope patterns lithography mass spectrometer mass spectrometers mass spectrometry Materials molecular weight msFineAnalysis AI MXene NMR Upgrade Nuclear Magnetic Resonance odd-electron ions Pesticide Analysis Petrochemical Analysis Petroleum Pittcon Pyrolysis-GC-MS Pyrolyzate SEM SEM-EDS semiconductor TD DART-MS Thermal Desorption time-of-flight unsaturation

How helium DART-MS forms positive ions

Learn the most common mechanism responsible for forming positive ions in DART-MS

What is DART-MS—the Ion Source for Ambient Ionization Mass Spectrometry?

An introduction to DART-MS and ambient ionization mass spectrometry.

Japan Academy Prize for Electron Microscopy Goes to University of Tokyo Professor Yuichi Ikuhara and Professor Naoya Shibata

Awarded for development of State-of-the-Art Electron Microscopy and their contribution to Nano Interface Technology (Joint Research).

Microscopy Community Celebrates Wil Bigelow

Friends of Prof. Wilbur (Wil) Bigelow, Professor Emeritus at University of Michigan and Fellow of the Microscopy Society of America, threw a surprise 100th birthday party for him at the University of Michigan’s Dept. of Materials Science & Engineering in Ann Arbor.

PANIC 2023: Conference Notes & Recorded Symposium

Not able to attend PANIC 2023? Review the highlights of the show and watch our recorded NMR mini symposium!

Petrochemical Analysis Using Soft- and Hard-Ionization | GCxGC-HRTOFMS

The combination of GCxGC, high resolution MS, and soft ionization provides the information needed to effectively analyze complex petrochemical samples.

Super-Charged Mass Spectral Data Processing

Automated Structural Analysis using AI and GC-HRTOFMS

Get to know JEOL de Mexico

For more than 30 years, the JEOL sales and service office in Mexico has been the resource for electron microscopes and microprobes, as well as NMR and Mass Spectrometers.