JEOL USA Elemental Analysis

From our benchtop SEM to our highest-resolution FE SEM, we offer an EDS spectrometer designed by JEOL exclusively for each model of JEOL Scanning Electron Microscope.

Higher sensitivity and low-energy X-ray detection down to lithium.

Soft X-ray emission spectrometer that utilizes a variable space grating, allowing the efficient and parallel collection of very low energy-rays (so called “soft” X-rays).

Ultrafast elemental mapping of S/TEM samples.

Energy dispersive X-ray fluorescence spectrometer.