JEOL USA Sample Preparation Tools

JEOL produces high precision instruments designed to prepare samples prior to imaging with the SEM or TEM.

From Focused Ion Beam (FIB) systems to a benchtop broad ion beam Cross Section Polisher, we offer a selection of specialized instruments to quickly prepare precise cross sections of semiconductor devices, metals, ceramics, multi-layer structures and also environment or beam sensitive materials.

JEOL also offers a line of sputter and evaporative coaters (metal or carbon) that facilitate imaging and analysis of non-conductive samples. These and other peripheral pieces of equipment complement JEOL’s comprehensive line of electron microscopes.

INSTRUMENTS

SEM Sample Prep

  • Cross Section Polisher
    Easy-to-use, sample preparation device for SEM, EPMA, and SAM applications
  • Smart Coater
    Simple-to-use sputter coater with fully automated vacuum and sputtering
  • Ion Slicer
    Innovative Specimen Preparation Method for TEM / STEM / SEM / EPMA / AUGER

TEM and SEM Sample Prep

  • Vacuum Evaporator
    Clean, oil-free, automatic evacuation system for carbon coating of samples

Focused Ion Beam

  • JIB-4700F Multi Beam System
    Combines SEM with FIB column for high-resolution SEM observation and analysis after high-speed cross-section milling with FIB
  • JIB-4000PLUS
    Focused ion beam processing and observation system (single-beam FIB system) featuring a high-performance ion column