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accurate mass AccuTOF-DART Additive Manufacturing Aerospace ambient ionization Analysis atmospheric pressure interface Batteries Chromatography CID collision-induced dissociation cone voltage Cryo-EM DART DART-MS Deformulation Direct Analysis in Real Time direct write double bond equivalents ebeam EDS Electron Beam Powder Bed Fusion elemental composition even-electron ions fragment ions fragmentation GC-Alpha GC-HRTOFMS GC-MS/MS GCxGC-HRTOFMS General Gulf Coast Conference Image Contest in-source CID isomers isotope measurements isotope patterns lithography mass spectrometer mass spectrometers mass spectrometry Materials molecular weight msFineAnalysis AI MXene NMR Upgrade Nuclear Magnetic Resonance odd-electron ions Pesticide Analysis Petrochemical Analysis Petroleum Pittcon Pyrolysis-GC-MS Pyrolyzate SEM SEM-EDS semiconductor TD DART-MS Thermal Desorption time-of-flight unsaturation

JEOL USA
JEOL USA's Blog

JEOL Additive Manufacturing with 3D Printer

JEOL and Additive Manufacturing – why JEOL developed a new 3D Printer

JEOL expertise in electron optics lead to development of e-beam melting 3D metal printer

An overview of electron beam lithography

Electron beam lithography uses a focused electron beam to pattern the surface of a material. As electron beams can be very tightly focused and small beam sizes achieved, electron beam lithography can be used to create very intricate structures for a wide variety of nanofabrication applications.

Achieving Pristine Cross Sections of Battery Samples for SEM

Achieving Pristine Cross Sections of Battery Samples for Scanning Electron Microscopy

JEOL’s Cooling Cross Section Polisher for Lithium Ion Batteries uses broad ion beam milling to prepare artifact-free cross-sections for SEM.

cryo-electron microscopy images and microscope

What is Cryo-Electron Microscopy Used for?

Cryo-electron microscopy is an imaging method that has revolutionized the recording 3D images of the structures of proteins.

How Cryo-EM Differs from TEM

Cryo-electron microscopy (cryo-em) and transmission electron microscopy (TEM) share many similarities, but their main difference is in sample prep.

Choosing the right scanning electron microscope for your laboratory

This article introduces the imaging technique scanning electron microscopy (SEM) and gives readers guidance on the criteria to consider when choosing the right type of SEM instrument.

Suiting Up with NanoSuit for Imaging in the SEM

FAU Owls Lab uses a unique biofilm for imaging microorganisms in the NeoScope Tabletop Scanning Electron Microscope

Carbon Nanotubes imaged by TEM (L) and SEM (R)

Scanning Electron Microscopes Vs Transmission Electron Microscopes

Two of the most popular electron microscopy methods make use of scanning electron microscopes (SEM) and transmission electron microscopes (TEM).

A New (Faster) Method for Pesticide Analysis: LPGC and Short Collision Cell Technology

Dramatically reduce analysis time of GC-MS/MS pesticide measurement by combining the separation efficiency and decreased elution time of an LPGC column with the enhanced SRM switching speed of the short collision cell of JEOL’s JMS-TQ4000GC.