above: A few images from M&M 2023 July 24-27 in Minneapolis.
One thing you can be sure of at the annual
Microscopy & Microanalysis show is the camaraderie and enthusiasm that permeates the exhibit floor. It’s a time to showcase new technology, new ideas, and to revitalize relationships and reflect on how the field has evolved. We were pleased to add a little fun to the conference this year – a caricature artist and an origami artist were kept busy during the two days they were there – we hope everyone enjoyed the experience!
The JEOL booth is designed with separate bays for each instrument, and our awesome SEM and TEM applications teams were delighted to perform live demonstrations on five different microscopes. Our newest Scanning Electron Microscopes, the
JSM-IT210 tungsten SEM and
JSM-IT710 High Resolution FE SEM, were introduced on opening day. The new capabilities of these SEMs were showcased in two informal talks given by
Dr. Kayleigh Harvey and
Dave Edwards of JEOL with concurrent demonstrations: “Automation Workflows for Imaging with Simple SEM and Python Scripting” and “Automation Workflows for EDS with Montage”.
Several attendees brought their own samples to look at, including a spider fang from
Lichen Labs which attracted a lot of interest at the SEM. In addition to the flagship Field Emission SEM Series, the
JSM-IT800SHL, we also demonstrated the popular benchtop SEM, the
JCM-7000 NeoScope. There was something for everyone!
We spotlighted
EPMA on Monday in an afternoon presentation by
Peter McSwiggen and
Anette von der Handt. “EPMA, Micrometeorites, SXES, and More” was both informative and fun. Congratulations to Anette for her distinguished technical contributions to the field of microanalysis, earning her the 2023 K. F. J. Heinrich Award from the Microanalysis Society. Also, congratulations to
Dr. Emma Bullock for the Best Contributed Paper, Birks Award!
The number of attendees who work with Transmission Electron Microscopes was notable, and while we couldn’t bring our extensive TEM line, we were pleased to once again be able to demonstrate the
JEM-1400 Plus TEM live in our booth. Aways popular with attendees, it was equipped with the latest technology as well as the new
Gatan Metro counting camera, which was also showcased in one of our two Lunch & Learn sessions with
Dr. Benjamin Miller of Gatan.
The new JEOL
FIB-SEM PS500i generated a lot of interest among attendees, and we highlighted the cutting-edge features in a video as well as an After-Hours Tutorial on Tuesday, with a presentation by
Dr. Patrick Phillips of JEOL.
Advanced TEM topics on Wednesday spotlighted “Optimizing Dose in STEM” presented by
Bryan Reed of IDES, and “Revealing the Latent Atomic World through Data-Driven Microscopy” presented by
Dr. Steven R. Spurgeon of PNNL. Dr. Spurgeon is the lead author on the feature article in this year’s
JEOL News which is available on our website for downloading, or you can request a printed copy.
JEOL was pleased to sponsor the Pre-meeting Congress X64 “Hardware & Software Developments in Electron Microscopy” session, the FIB and Machine Intelligence Symposia, and the CryoEM Poster Session.
Not in the booth but represented were our new
3D Metal Printer JAM-5200EBM for those who work in additive manufacturing, and of course our CRYO ARM TEMs for Single Particle Analysis.
We were also delighted to host
STEM students attending the conference to present a poster. Read more about the work that they did with the help of JEOL microscopy.
We hope everyone enjoyed the conference and we are thrilled to have been able to meet attendees in person. Congratulations to the 3 winners of our first-ever raffle! We had fun handing out giveaways, too. Want to share any photos? Mention #JEOLUSA on Twitter (or X?) and @JEOLUSA on LinkedIn. Reach out to us if you have questions at
jeolink@jeol.com.