Benchtop SEM is used in industry and academia to characterize nanosized particles’ morphological, topographical, and chemical characteristics.
Benchtop SEM is a key analytical tool in investigating materials' batteries, fuel cells, supercapacitors, electrolyzers and heterogeneous catalysts.
Discover how SEM and TEM microscopes are analytical tools that use Energy Dispersive X-ray detectors (EDS or EDX) and SXES for elemental analysis down to Lithium.
Learn more about JEOL's air-isolated workflow, pristine sample preparation of sensitive samples, and high-resolution imaging and analysis solutions.
SEM-EDS mapping can help to analyze element distributions within various materials. Find out how this reliable method is utilized in our latest article!
Explore the pivotal role of SEM-EDS in advanced materials analysis, its applications, advantages, and future prospects in this informative technical article.
NeoScope benchtop SEM plays a pivotal role in pharmaceutical design and manufacture
MXenes are a new family of 2D crystalline nanomaterials explored for energy applications using SEM microscopy
Explore JEOL's Gather-X Windowless EDS: a breakthrough in SEM-EDS technology for unprecedented sensitivity and spatial resolution in elemental analysis.