JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Cryo-Electron Ptycography: Applications in the Characterisation of Biological Samples
    • Current Status and Future Development of In-situ Liquid Cell Transmission Electron Microscopy
    • Broad Ar Ion Beam Milling Improves EBSD Analysis of Phyllosilicates
    • Complete Classification, Separation, and Accurate Analysis of Fragment Ions Produced by Electron Ionization of Methyl Stearate using a High-Performance Mass Spectrometer
    • Observation of Radicals in Clathrate Hydrates and Silica Clathrates
    • Microstructure Analysis of Carbon and Nitrogen in Nitrocarburized Carbon Steel Using EPMA Scatter Diagram Method
    • Crystal Structure Elucidation of Small Organic Molecules: Combined Approach of 3D Electron Diffraction and SOlid-State NMR
    • Operando Observation Using an In-situ Gas Reaction System Connected to a Transmission Electron Microscope (TEM) and a Mass Spectrometer (MS)
    • Development of JBX-A9, Electron Beam Lithography System
    • Introduction of JEOL Products

JEOL NEWS Magazine (previous issues)

  • Vol. 39 No. 1, 2004 Vol. 39 No. 1, 2004
    • A Double Aberration Corrected, Energy Filtered HREM/STEM
    • Variable Magnification of Electron Holography for Junction Profiling of Semiconductor Devices with Dual Lens System on JEOL JEM-2010F
    • The Electron Backscatter Diffraction Technique – A Powerful Tool to Study Microstructures by SEM
    • Growth and Encystment of the Ciliate Tetrahymena sp. Found in a Dead Mosquito's Larva
    • ALCHEMI Studies on Quasicrystals
    • Electron Spin Resonance Spectroscopy in Food Radiation Research
    • Cross Section Specimen Preparation Device Using Argon Ion Beam for SEM
    • Introduction of new products
  • Vol. 38 No. 2, 2003 Vol. 38 No. 2, 2003
    • Atomic Resolved HAADF-STEM for Composition Analysis
    • Atomic Structure Analysis
    • Direct Imaging of a Local Thermal Vibration Anomaly Through In-situ High-temperature ADF-STEM
    • Cold-spray Ionization Mass Spectrometric Observation of Biomolecules in Solution
    • Electron Spin Resonance (ESR) in Nanocarbon Research
    • Analysis of Cadmium (Cd) in Plastic Using X-ray Fluorescence Spectroscopy
    • JWS-3000 High-Resolution Review SEM
    • Application and Extension of Pickup Method to Various Materials
    • Introduction of New Products
  • Vol. 38 No. 1, 2003 Vol. 38 No. 1, 2003
    • Mapping of sp2/sp3 in DLC Thin Film by Signal Processed ESI series Energy Loss Image
    • Electron Holographic Analysis of Nanostructured Gold Catalyst
    • Single Atomic Column Observation in Silicon Boundary
    • The Scanning Electron Microscope as a Tool for Experimental Nanomechanics
    • Observation of Dislocation Structure of Fatigued Metallic Materials by Scanning Electron Microscopy
    • Protein NMR - Ability of the JNM-ECA series
    • Development of the JBX-3030MV Mask Making E-Beam Lithography System
    • Chromatic and Spherical Aberration Correction in the LSI Inspection Scanning Electron Microscope
    • Peak Deconvolution Analysis in Auger Electron Spectroscopy II
    • Applications of Micro-Area Analysis Used by JPS-9200 X-ray Photoelectron Spectrometer
    • Introduction of New Products
  • Vol. 37 No. 1, July 2002 Vol. 37 No. 1, July 2002
    • A Cs Corrected HRTEM: Initial Applications in Materials Science
    • Quantitative Environmental Cell - Transmission Electron Microscopy: Studies of Microbial Cr(VI) and Fe(III) Reduction
    • Simulations of Kikuchi Patterns and Comparison with Experimental Patterns
    • Experimental Atomically Resolved HAADF-STEM Imaging - A Parametric Study
    • Observation of Waterborne Protozoan Oocysts Using a Low-Vacuum SEM
    • A Possible Efficient Assay: Low-Vacuum SEM Freeze Drying and Its Application for Assaying Bacillus thuringiensis Formulations Quality
    • Observations of Algae and Their Floc in Water Using Low-Vacuum SEM and EDS
    • Development of Nano-Analysis Electron Microscope JEM-2500SE
    • Development of JSM-7400F
    • New Secondary Electron Detection Systems Permit Observation of Non-Conductive Materials
    • Applications of Image Processing Technology in Electron Probe Microanalyzer
    • Technology of Measuring Contact Holes Using Electric Charge in a Specimen
    • Organic EL Display Production Systems - ELVESS Series
    • In-Situ Observation of Freeze Fractured Red Blood Cell with High-Vacuum Low-Temperature Atomic Force Microscope
    • Peak Deconvolution of Analysis in Auger Electron Spectroscopy
    • JEOL's Challenge to Nanotechnology
    • Progress in Development of High-Density Reactive Ion Plating
    • Applications of High-Power Built-in Plasma Gun
    • Introduction of New Products
  • Vol. 35 No. 1, July 2000 Vol. 35 No. 1, July 2000
    • 100kV E-Beam Lithography System: JBX-9300FS
    • Gate Oxide Characterization using Annualr Dark Field Imaging
    • JEOL Intro of New Products
    • Kankan Diamonds (Guinea): probing the lower mantle
  • Vol. 34 No. 1, July 1999 Vol. 34 No. 1, July 1999
    A 1000kV TEM Running Over 25 Years
    • Atomic Resolution Z-Contrast Imaging of Interfaces and Defects
    • The Growing Role of Electron Crystallography in Structural Biology
    • Factors Promoting R&D in Electron Microscopy in Japan
    • The Development and Assessment of a High Performance FE Gun Analytical HREM for Materials Science Applications
    • Immunogold-labeling in Scanning Electron Microscopy
    • Measure Contact Potential Difference Using an Ultrahigh Vacuum Noncontact Atomic Force Microscope
    • Microscopic Chemical State Analysis by FE-SAM with Hemispherical Energy Analyzer
    • Miniaturized STM Working Simultaneously in UHV Electron Microscope
    • High-Resolution Electron-Beam Lithography and Its Application toMOS Devices
    • Development of Optical Technology for JEOL's Electron Probe Instruments
    • Observation of Protein Structures through an Electron Beam
    • Transition of JEOL's Semiconductor Equipment, and Future Development
    • Applicatrion of Semi-in-Lens FESEM for Chargeless Observation
    • Development History of JEOL's Transmission Electron Microscopes
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  • Vol. 54 No. 1, July 2019 Vol. 54 No. 1, July 2019
    • Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
    • Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
    • Analytical SEM and TEM: Applications in Product-related Material Development
    • Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
    • Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
    • Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
    • High-Field DNP Using Closed-Cycle Helium MAS System
    • Application of "operando -ESR" to Organic Electronics Materials
    • YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
    ‒ Characterization of Biomimetic Lacquer ‒
    • Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
    • Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
    • Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
    • Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC
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