JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Cryo-Electron Ptycography: Applications in the Characterisation of Biological Samples
    • Current Status and Future Development of In-situ Liquid Cell Transmission Electron Microscopy
    • Broad Ar Ion Beam Milling Improves EBSD Analysis of Phyllosilicates
    • Complete Classification, Separation, and Accurate Analysis of Fragment Ions Produced by Electron Ionization of Methyl Stearate using a High-Performance Mass Spectrometer
    • Observation of Radicals in Clathrate Hydrates and Silica Clathrates
    • Microstructure Analysis of Carbon and Nitrogen in Nitrocarburized Carbon Steel Using EPMA Scatter Diagram Method
    • Crystal Structure Elucidation of Small Organic Molecules: Combined Approach of 3D Electron Diffraction and SOlid-State NMR
    • Operando Observation Using an In-situ Gas Reaction System Connected to a Transmission Electron Microscope (TEM) and a Mass Spectrometer (MS)
    • Development of JBX-A9, Electron Beam Lithography System
    • Introduction of JEOL Products

JEOL NEWS Magazine (previous issues)

Vol. 43 No. 1, July 2008

• Interface Studies by Cs-Corrected STEM
• Field Emission AES Characterization of Corrosion Products Formed on Copper in Chloride Containing Solutions
• Characterization of Coherent Precipitates in Mg-RE(-Zn) (RE: Gd, Y) Alloys by the Combination of HRTEM and HAADF-STEM
• Quantitative Electron Microscopy Using Digital Data Processing
• Case Study on Failure Analysis by Electron Beam Absorbed Current Method
• Featured Article from Recipient of the Ernst Ruska Award 2007: Recent Advances in Transmission Electron Microtomography for Materials Research
• Featured Article of Electron Spin Resonance (ESR) Spectroscopy: ESR Study of the Fundamentals of Radical Polymerizations Characteristic Features of JIB-4500 MultiBeam System
• High Power Electron Beam Source Used for Melting Metal Materials
• Introduction of New Products

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