JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Cryo-Electron Ptycography: Applications in the Characterisation of Biological Samples
    • Current Status and Future Development of In-situ Liquid Cell Transmission Electron Microscopy
    • Broad Ar Ion Beam Milling Improves EBSD Analysis of Phyllosilicates
    • Complete Classification, Separation, and Accurate Analysis of Fragment Ions Produced by Electron Ionization of Methyl Stearate using a High-Performance Mass Spectrometer
    • Observation of Radicals in Clathrate Hydrates and Silica Clathrates
    • Microstructure Analysis of Carbon and Nitrogen in Nitrocarburized Carbon Steel Using EPMA Scatter Diagram Method
    • Crystal Structure Elucidation of Small Organic Molecules: Combined Approach of 3D Electron Diffraction and SOlid-State NMR
    • Operando Observation Using an In-situ Gas Reaction System Connected to a Transmission Electron Microscope (TEM) and a Mass Spectrometer (MS)
    • Development of JBX-A9, Electron Beam Lithography System
    • Introduction of JEOL Products

JEOL NEWS Magazine (previous issues)

Vol. 49 No. 1, Sept. 2014

• Development of Aberration Corrected Differential Phase Contrast (DPC) STEM
• Atomic-Resolution Characterization Using the Aberration-Corrected JEOL JEM-ARM200CF at the University of Illinois – Chicago
• Quantitative Characterization of Magnetic Materials Based on Electron Magnetic Circular Dichroism with Nanometric Resolution Using the JEM-1000K RS Ultra-High Voltage STEM
• Photonic Crystal Lasers
• Electron Microprobe Study of the Yinxu (Anyang) Bronze of Academia Sinica Collection
• Elucidation of Deterioration Mechanism for Organic Solar Cells – Toward Highly Efficient Solar Cells; Super High Resolution Imaging with Atomic Resolution Electron Microscope of JEM-ARM300F
• Advanced Analysis of Active Materials in Li-Ion Battery by XPS and AES
• Characteristic Features and Applications of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe X-ray Microanalyzers and Scanning Electron Microscopes
• Analysis of Organic Thin Films by the Laser Desorption/Ionization Method Using the JMS-S3000 “SpiralTOF”
• Ultra-Low-Temperature-Probes (UltraCOOL™ probe / SuperCOOL™ probe)
• New Series of NMR Spectrometers JNM-ECZ

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