JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Cryo-Electron Ptycography: Applications in the Characterisation of Biological Samples
    • Current Status and Future Development of In-situ Liquid Cell Transmission Electron Microscopy
    • Broad Ar Ion Beam Milling Improves EBSD Analysis of Phyllosilicates
    • Complete Classification, Separation, and Accurate Analysis of Fragment Ions Produced by Electron Ionization of Methyl Stearate using a High-Performance Mass Spectrometer
    • Observation of Radicals in Clathrate Hydrates and Silica Clathrates
    • Microstructure Analysis of Carbon and Nitrogen in Nitrocarburized Carbon Steel Using EPMA Scatter Diagram Method
    • Crystal Structure Elucidation of Small Organic Molecules: Combined Approach of 3D Electron Diffraction and SOlid-State NMR
    • Operando Observation Using an In-situ Gas Reaction System Connected to a Transmission Electron Microscope (TEM) and a Mass Spectrometer (MS)
    • Development of JBX-A9, Electron Beam Lithography System
    • Introduction of JEOL Products

JEOL NEWS Magazine (previous issues)

Vol. 37 No. 1, July 2002

• A Cs Corrected HRTEM: Initial Applications in Materials Science
• Quantitative Environmental Cell - Transmission Electron Microscopy: Studies of Microbial Cr(VI) and Fe(III) Reduction
• Simulations of Kikuchi Patterns and Comparison with Experimental Patterns
• Experimental Atomically Resolved HAADF-STEM Imaging - A Parametric Study
• Observation of Waterborne Protozoan Oocysts Using a Low-Vacuum SEM
• A Possible Efficient Assay: Low-Vacuum SEM Freeze Drying and Its Application for Assaying Bacillus thuringiensis Formulations Quality
• Observations of Algae and Their Floc in Water Using Low-Vacuum SEM and EDS
• Development of Nano-Analysis Electron Microscope JEM-2500SE
• Development of JSM-7400F
• New Secondary Electron Detection Systems Permit Observation of Non-Conductive Materials
• Applications of Image Processing Technology in Electron Probe Microanalyzer
• Technology of Measuring Contact Holes Using Electric Charge in a Specimen
• Organic EL Display Production Systems - ELVESS Series
• In-Situ Observation of Freeze Fractured Red Blood Cell with High-Vacuum Low-Temperature Atomic Force Microscope
• Peak Deconvolution of Analysis in Auger Electron Spectroscopy
• JEOL's Challenge to Nanotechnology
• Progress in Development of High-Density Reactive Ion Plating
• Applications of High-Power Built-in Plasma Gun
• Introduction of New Products

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