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PRODUCTS
Scanning Electron Microscopes (SEM)
HV/LV Tungsten/LaB6 SEMs
JSM-IT210
JSM-IT510
High-Res, Large-Chamber SEM
JSM-IT710HR
Benchtop
NeoScope Benchtop SEM
FE SEM
JSM-IT810
SEM-FIB
JIB-4700F / MultiBeam
JIB-4000 / MultiBeam
Elemental Analysis
Transmission Electron Microscopes (TEM)
120 kV
JEM-120i
200 kV
NEOARM
Monochromated ARM200F
JEM-F200 F2
JEM-2100Plus
CRYO ARM™ 200
JEM-ACE200F
JEM-Z200MF
300 kV
JEM-ARM300F2
CRYO ARM™ 300 II
Analytical & Data Optimization
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
TEMPO
PULSE System
Environmental Control Solutions
Focused Ion Beam
CRYO-FIB-SEM
JIB-PS500i
JIB-4700F
Sample Preparation Tools
Cross Section Polisher
Vacuum Evaporator
Smart Coater
Carbon Coater
UV Cleaner
Auto Fine Coater
Nuclear Magnetic Resonance
JNM-ECZL series FT NMR
Probes
ROYALPROBE
ROYALPROBE HFX
Cryogenic Probes for NMR
Liquids/Solution State Probes
AutoMAS Solids Probe
HCN MAS and HXY NMR Probes
Solid State NMR Probes
NMR Probe Key Features and Applications
Delta NMR Software
CRAFT for Delta
NMR in pharma
qNMR
Magnets
Sample Changers
Cryogen Reclamation System
Electron Spin Resonance
JES-X330
JES-X320
JES-X310
Mass Spectrometers
AccuTOF DART
AccuTOF DART Technology
AccuTOF DART Ionization Mechanisms
AccuTOF Time-of-Flight Mass Analyzer
AccuTOF DART High-Resolution Accurate Mass
AccuTOF GC-Alpha
msFineAnalysis AI
AccuTOF GCxGC MS
AccuTOF LC-Express
GC/Single-Quadrupole Mass Spectrometer
NETZSCH And JEOL
msFineAnalysis iQ
GC/Triple-Quadrupole Mass Spectrometer
msFineAnalysis iQ
MALDI SpiralTOF TOF/TOF
msRepeatFinder Polymer Analysis Software
MALDI Imaging SpiralTOF
UltraFOCUS DIOXIN Analysis
Microprobe (EPMA) and Auger
JXA-iHP200F
JXA-iSP100
JAMP-9510F
Soft X-Ray Emission Spectrometers
Photomask / Direct Write Lithography
Electron Beam Lithography
JBX-A9
JBX-8100FS
JBX-3050MV
Elemental Analysis
Embedded EDS for SEM
Gather-X Windowless EDS
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S XRF
Correlative Microscopy Solutions
Additive Manufacturing 3D Printer
Medical Equipment
BioMajesty Series
JCA-6010/C
JCA-BM 6050
JCA-9130/C
JCA-BM 2250
JCA-BM 8000 Series
Industrial Equipment
High-Power Electron Beam Sources
Electron Beam Sources
BS-60050EBS Electron Beam Source
EB Source Power Supply
Plasma Source
Rotary Sensor
APPLICATIONS
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Battery Materials
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Energy
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SEE MORE HERE
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SEM Applications
TEM Applications
NMR Applications
FIB Applications
Mass Spec Applications
Sample Prep Applications
REALab Customer Stories
Center for Biologic Imaging at University of Pittsburgh
Lake Superior State University
Yokogushi (Cross-Platform Analysis)
RESOURCES
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Walkup NMR
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Directions to JEOL USA
PRODUCTS
Scanning Electron Microscopes (SEM)
HV/LV Tungsten/LaB6 SEMs
JSM-IT210
JSM-IT510
High-Res, Large-Chamber SEM
JSM-IT710HR
Benchtop
NeoScope Benchtop SEM
FE SEM
JSM-IT810
SEM-FIB
JIB-4700F / MultiBeam
JIB-4000 / MultiBeam
Elemental Analysis
Transmission Electron Microscopes (TEM)
120 kV
JEM-120i
200 kV
NEOARM
Monochromated ARM200F
JEM-F200 F2
JEM-2100Plus
CRYO ARM™ 200
JEM-ACE200F
JEM-Z200MF
300 kV
JEM-ARM300F2
CRYO ARM™ 300 II
Analytical & Data Optimization
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
TEMPO
PULSE System
Environmental Control Solutions
Focused Ion Beam
CRYO-FIB-SEM
JIB-PS500i
JIB-4700F
Sample Preparation Tools
Cross Section Polisher
Vacuum Evaporator
Smart Coater
Carbon Coater
UV Cleaner
Auto Fine Coater
Nuclear Magnetic Resonance
JNM-ECZL series FT NMR
Probes
ROYALPROBE
ROYALPROBE HFX
Cryogenic Probes for NMR
Liquids/Solution State Probes
AutoMAS Solids Probe
HCN MAS and HXY NMR Probes
Solid State NMR Probes
NMR Probe Key Features and Applications
Delta NMR Software
CRAFT for Delta
NMR in pharma
qNMR
Magnets
Sample Changers
Cryogen Reclamation System
Electron Spin Resonance
JES-X330
JES-X320
JES-X310
Mass Spectrometers
AccuTOF DART
AccuTOF DART Technology
AccuTOF DART Ionization Mechanisms
AccuTOF Time-of-Flight Mass Analyzer
AccuTOF DART High-Resolution Accurate Mass
AccuTOF GC-Alpha
msFineAnalysis AI
AccuTOF GCxGC MS
AccuTOF LC-Express
GC/Single-Quadrupole Mass Spectrometer
NETZSCH And JEOL
msFineAnalysis iQ
GC/Triple-Quadrupole Mass Spectrometer
msFineAnalysis iQ
MALDI SpiralTOF TOF/TOF
msRepeatFinder Polymer Analysis Software
MALDI Imaging SpiralTOF
UltraFOCUS DIOXIN Analysis
Microprobe (EPMA) and Auger
JXA-iHP200F
JXA-iSP100
JAMP-9510F
Soft X-Ray Emission Spectrometers
Photomask / Direct Write Lithography
Electron Beam Lithography
JBX-A9
JBX-8100FS
JBX-3050MV
Elemental Analysis
Embedded EDS for SEM
Gather-X Windowless EDS
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S XRF
Correlative Microscopy Solutions
Additive Manufacturing 3D Printer
Medical Equipment
BioMajesty Series
JCA-6010/C
JCA-BM 6050
JCA-9130/C
JCA-BM 2250
JCA-BM 8000 Series
Industrial Equipment
High-Power Electron Beam Sources
Electron Beam Sources
BS-60050EBS Electron Beam Source
EB Source Power Supply
Plasma Source
Rotary Sensor
APPLICATIONS
Application List
Battery Materials
Ceramics
Chemistry
Energy
Failure Analysis
Forensics
Geology Solutions
Life Sciences
Materials Science
Nanotechnology
Semiconductor
SEE MORE HERE
Application List By Product
SEM Applications
TEM Applications
NMR Applications
FIB Applications
Mass Spec Applications
Sample Prep Applications
REALab Customer Stories
Center for Biologic Imaging at University of Pittsburgh
Lake Superior State University
Yokogushi (Cross-Platform Analysis)
RESOURCES
Electron Optics
Documents & Downloads
Image Gallery
FAQs
Links & Resources
Videos
Scanning Electron Microscopy Basics
Analytical Instruments
Documents & Downloads
Walkup NMR
Reference Data
Tutorials (Mass Spec)
Tutorials (NMR)
No-D NMR
Non Uniform Sampling (NUS)
Mass Spectrometry Basics
NMR Basics
NMR Magnet Destruction
Photomask / Direct Write Lithography
Documents & Downloads
Sample Preparation
Documents & Downloads
Image Gallery
Additive Manufacturing
Webinars and Videos
Posters
JEOL Periodic Table App
JEOL MS Calculator App
Financing
SERVICE / SUPPORT
JEOL USA Service & Support
Request Service
Offered Services
Service Level Agreements
Instrument Training
SEM/TEM Training
NMR Training
Mass Spectrometry Training
Parts Center
Purchase
Request for Quotation
General Inquiry
NEWS & EVENTS
Blog
Press Releases
JEOL in the News
Events & Shows
JEOL USA Image Contest
2024 Entries & Winners
2023 Entries & Winners
2022 Entries & Winners
2021 Entries & Winners
2020 Entries & Winners
2019 Entries & Winners
2018 Entries & Winners
2017 Entries & Winners
2016 Entries & Winners
2015 Entries & Winners
2014 Entries & Winners
NeoScope Image Contest
JEOL USA Image Contest Entry Form
JEOL NEWS Magazine
JEOL Newsletters
JEOLink Newsletter
Mass Media Newsletter
JEOLink NMR Newsletter
ABOUT US
The Company
Career Opportunities
Corporate Benefits
Current Career Opportunities
Submit Application
Milestones
Management Team
FAQs
CONTACT US
JEOL USA Headquarters
JEOL Regional Web Sites
Find a Local Sales Rep
Additive Manufacturing
EB Lithography (Direct Write)
Electron Microscopy
ESR, NMR, Mass Spectrometry
Find a Local Service Office
Electron Microscopy / EB Lithography
ESR, NMR, Mass Spectrometry Instruments Service
Request Product Info
Directions to JEOL USA
NEWS & EVENTS
JEOL Newsletters
JEOLink Newsletter
JEOL
ink
Newsletter
Subscribe to the JEOL
ink
newsletter
September 2016
2016
• Failure Analysis with the SEM
• Tech Note: STEM-in-SEM
• UT Dallas Engineers Characterize a Novel Transistor
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