JEOL USA Press Releases

March 9, 2015 (Pittcon, New Orleans) -- JEOL is proud to celebrate the 10th anniversary of the introduction of the enormously popular AccuTOF-DART® ambient ionization mass spectrometer by introducing the new AccuTOF-DART®4G at Pittcon 2015, with new performance capabilities including enhanced resolution, speed, and accuracy in a rugged, flexible, versatile design. The AccuTOF-DART 4G couples the facile operation of the DART (Direct Analysis in Real Time) ion source with the high-resolution, accurate mass capability ...

February 19, 2015, Peabody, MA -- With the increased frequency in the use of improvised explosive devices (IEDs), there is a growing need for crime scene investigators to rapidly detect minute traces of explosive materials as well as link the devices to a person of interest. Whenever a latent fingerprint is found at the scene, most analytical techniques would involve use of a swab to take a sample, destroying the fingerprint in the process, ...

(January 13, 2015 -- Peabody, Mass.) JEOL USA and the University of California's Irvine Materials Research Institute (IMRI) have entered into a strategic partnership to create a premier electron microscopy and materials science research facility. The IMRI will serve as an interdisciplinary nexus for the study and development of new materials, enabling advances in solar cell, battery, semiconductor, biological science, and medical technologies.  The IMRI is headed by Dr. Xiaoqing Pan, an internationally-recognized researcher ...

December 15, 2014 (Peabody, MA) -- JEOL USA is pleased to announce a new program that, for a limited time, offers NMR users in the Americas the opportunity to replace their NMR consoles at a special price.  For more than 50 years, JEOL has been known for its legendary support. The company's wide range of NMR solutions are tailored to meet the needs of academic, industrial, and government customers whose applications range from routine experiments ...

October 7, 2014 (Peabody, MA) -- JEOL has introduced an easy-to-use, smart solution for high-sensitivity elemental analysis in a new benchtop EDXRF spectrometer. The JSX-1000S ElementEye analyzes major to trace components on most sample types - solids, powders, and liquids - with little or no sample preparation. The ElementEye complements SEM, EPMA, NMR, and mass spectrometry analyses, providing high-sensitivity qualitative and quantitative analysis results in minutes. A Thin Film FP method is optionally available for ...

JEOL Ltd. (President Gon-emon Kurihara) is pleased to announce the development and start of sales of a new atomic resolution electron microscope, JEM-ARM300F. Product development background Transmission electron microscopy (TEM) has long been a tool essential for micro structure evaluation in the field of materials development. However, as the fine structures of advanced materials are being designed at the nano level or atomic level, the synthetic process for such materials increasingly requires imaging and analysis at higher ...

JEOL Ltd. (President Gon-emon Kurihara) and JEOL RESONANCE, Inc. (President Takahiro Anai) is pleased to announce a new line of NMR spectrometers, JNM-ECZS series. The JNM-ECZS series is a next generation NMR spectrometer that incorporates ultra-high accuracy RF circuitry utilizing the latest digital high frequency technology. The compact spectrometer design features unprecedented levels of performance and expandability to support the most advanced NMR experiments. Features The 43% reduction in size of the JNM-ECZS series compared to ...

March 27, 2014 (Peabody, MA) -- JEOL and Nikon have integrated optical microscopy and field emission scanning electron microscopy in a way that enables seamless observation of the same region of interest on a sample with fast, accurate navigation. The technique, MiXcroscopy, employs the same specimen holder for both the optical microscope (OM) and the scanning electron microscope (SEM). The specimen stage registration is fully controlled by dedicated software that allows the OM and ...

March 6, Peabody, Mass. -- JEOL USA has launched an imaging contest to showcase some of the best work of users of its electron microscopes. A winning image will be selected for each month of 2014, judged by JEOL's SEM and TEM applications teams for their technical and artistic qualities. "Many customers have asked us about launching an image contest, so we decided to do just that starting this year. JEOL SEM and TEM users ...

March 3, 2014 (Pittcon, Chicago, IL) -- The AccuTOF GCV 4G time-of-flight mass spectrometer that JEOL introduced at last year’s PittCon has received great interest from the mass spectrometry community. JEOL USA, Inc. has received several purchase orders from industrial and academic laboratories, with systems already delivered and installed in the US and Canada. In collaboration with JEOL, GC Image LLC and Zoex have continued to enhance the GC Image software to extend the ability ...