JEOL USA Press Releases

July 10, 2012 (Semicon West, San Francisco, CA) -- Since its initial introduction in 2008, the JEOL NeoScope benchtop Scanning Electron Microscope (SEM), represented by Nikon Instruments, has been used for inspection of electronic parts, forensics analysis, pharmaceutical inspection, and imaging insects for student projects. It is also used in conjunction with both optical microscopes and traditional SEMs in the lab. Now JEOL introduces the NeoScope with higher magnification, multi-touch screen control, and a sleek ...

May 31, 2012 (Peabody, Mass.) -- JEOL's new series of field emission scanning electron microscopes is now complete with the introduction of the sub-nanometer imaging resolution JSM-7800F. The JSM-7800F represents a significant leap forward in Field Emission SEM technology, with unmatched resolution and stability for nanotechnology imaging and analysis. JEOL's highest performance FE-SEM makes it possible to: observe the finest structural morphology of nanomaterials at 1,000,000X magnification with sub-1nm resolution perform low kV imaging and analysis of ...

April 17, 2012 (Peabody, Mass.) -- JEOL launches a new series of Field Emission Scanning Electron Microscopes (FE-SEM) that offer expanded imaging and analysis capabilities customizable to performance requirements. The JEOL JSM-7100F series offers sub-1 nm imaging capabilities and analytical characterization at the sub-100nm scale, accomplished through the combination of large beam currents with a small probe size at any accelerating voltage. Designed for the budget-conscious lab, the JSM-7100F model is a highly versatile, easy-to-use ...

110kHz Magic Angle Spinning, a record for spinning speed with JEOL Resonance’s new 0.75 mm Solid State NMR Probe April 11, 2012 (Miami, Florida) -- JEOL Resonance, Inc., headquartered in Akishima, Tokyo, will announce a new 0.75 mm solid state NMR probe at the 53rd Experimental Nuclear Magnetic Resonance Conference that opens on April 15, 2012 in Miami, Florida. The probe is capable of high resolution sample analysis by spinning the sample at 110 kHz, ...

November 10, 2011 (Peabody, Mass.) JEOL USA, a leading supplier of scientific instruments in the Americas, was honored by a visit from the Consul General of Japan in Boston, Mr. Takeshi Hikihara, on Wednesday, November 9, 2011. As a representative of the Foreign Ministry, Mr. Hikihara serves Japanese communities and businesses throughout New England. JEOL USA was incorporated in the U.S. in 1962 and is a wholly-owned subsidiary of JEOL, Ltd which is headquartered ...

October 20, 2011 (Peabody, Mass.) -- JEOL USA Mass Spectrometry Product Manager, Dr. Robert (Chip) Cody, has received the prestigious Anachem Award, given by the Association of Analytical Chemistry for his contributions to the development of organic mass spectrometry. The award was presented at the Federation of Analytical Chemical and Spectroscopy Societies (FACSS) meeting in Las Vegas, Nevada, where Dr. Cody gave a plenary lecture entitled Massive Changes: Not just your grandma's mass spectrometer ...

October 3, 2011 (Peabody, Mass.) -- A leading supplier of electron microscopes and scientific instrumentation, JEOL USA (Peabody, Mass.) and its parent company JEOL Ltd. (Akishima, Japan) have opened an office in Sao Paulo, Brasil to support its growing installed base there, and have relocated the personnel to a new facility this month. JEOL has enjoyed a 40-year history in Brasil, with the past 30 being through its agent, Fugiwara Enterprises I.C., Ltda. As the ...

September 27, 2011 (Peabody, MA) -- JEOL USA, a leading supplier of scientific and industrial instrumentation including electron microscopes, mass spectrometers and nuclear magnetic resonance spectrometers, and headquartered in Peabody, Massachusetts, has entered an agreement with Arquimed, Ltda. making Arquimed JEOL’s exclusive agent in Chile. Arquimed, located in Santiago, has a 75-year history as one of Chile’s largest and most respected distributors of scientific, medical, educational, and industrial tools and equipment. While JEOL USA has ...

July 12, 2011 (Peabody, Mass.) -- A new 200kV Transmission Electron Microscope from JEOL delivers high throughput nano-analysis for process and quality control of mass produced semiconductor and materials samples. The multi-function JEOL JEM-2800 features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS); Electron Energy Loss Spectroscopy (EELS) for chemical analysis; critical dimension analysis; tomography; and in situ observation of samples. The ...

July 7, 2011 (Peabody, Mass.) -- JEOL has developed a new generation of Energy Dispersive Spectrometer (EDS) for ultrafast, ultrasensitive collection of X-rays through analysis with its Scanning Transmission Electron Microscopes (S/TEM). Centurio from JEOL is a novel Silicon Drift Detector (SDD) EDS that collects X-rays from samples at an unprecedented large solid angle of up to 0.98 steradians from a detection area of 100mm2. The larger the solid angle of measurement, the more ...