JEOL USA Press Releases

May 13, 2008 (Peabody, Mass.) -- JEOL USA has published the fourth edition of its popular collection of applications notes for open air mass spectrometry. The AccuTOF-DART Applications Notebook 4th edition is updated to include several new applications notes covering topics as diverse as real-time analysis of deoxynivalenol in beer to GC/MS using the DART™ ion source. The new book includes 58 pages of real-time analysis of pharmaceuticals, drugs in dose form or in ...

March 3, 2008 (Pittcon 2008, New Orleans, LA) -- Two of the world’s leading imaging equipment suppliers - Nikon Instruments and JEOL - have joined forces to bring a new benchtop SEM to the market. The two companies will jointly introduce the NeoScope at Pittcon 2008, March 3-6, in New Orleans, Louisiana. “The NeoScope partnership is a natural progression for both companies,” said Michael Metzger, General Manager of Sales and Marketing at Nikon Instruments in ...

Introduction In a recently published comparison1 of the ambient ionization techniques direct analysis in real time (DART™ 2) and DESI3, it was reported that a protonated molecule was not observed for DART, whereas the protonated molecule could be observed for DESI and DAPCI. This is an incorrect observation, resulting from the use of different experimental conditions for DART than were used for the other two techniques. Mass spectra of aspirin measured on a JEOL AccuTOF-DART™ ...

January 15, 2007 (Peabody, Mass.) -- JEOL USA announced today that Boston College has selected the new JEOL MultiBeam Focused Ion Beam system and a Field Emission Scanning Electron Microscope for its nanofabrication clean room facility in Newton, Massachusetts. As a result of Boston College’s continued investment in the sciences, the university opened its first clean room (class 1,000/10,000), which will be equipped with the JEOL models JIB-4500 MultiBeam and JSM-7001F Scanning Electron Microscope with ...

January 7, 2008 (Peabody, Mass.) -- JEOL USA introduces a new mobile Scanning Electron Microscope that can travel or easily be moved to different locations as needed. The new CarryScope is the ideal instrument for the mobile crime lab where imaging and analysis of trace evidence are conducted right at the crime scene. In the research or manufacturing setting, the CarryScope can be transported between the lab, conference room, or office for inspection of products ...

November 27, 2007, Peabody, Mass. -- JEOL USA introduces a new high throughput SEM/FIB that combines Focused Ion Beam micro milling with the high resolution imaging of the JEOL LaB6 electron column. The MultiBeam is a high-productivity tool for IC defect analysis, circuit modification, TEM thin film sample preparation, and mask repair. A versatile all-in-one system, the MultiBeam features Serial Slicing and Sampling (S3™) for in-process monitoring of milling, fabrication, and reconstructing 3D images of ...

November 5, 2007 (Peabody, Mass.) -- JEOL USA announced today that the University of Southern California (USC) has purchased six electron microscopes, including a newly introduced SEM-FIB (a dual column focused ion beam system) for the university's Center for Nano-Imaging in Los Angeles, California. USC is the first U.S. customer to purchase the new JEOL MultiBeam, the JIB-4500, a high-performance SEM and micromilling FIB with LaB6 source. The MultiBeam will be housed in new laboratory ...

One of the world's leading electron microscopes at Oak Ridge National Laboratory, the JEOL 2200FS Aberration Corrected Electron Microscope (ACEM), is controlled and manipulated from London via the Lambda Rail.

The recent acquisition of Jeol's latest 300 kV field emission Transmission Electron Microscope (TEM), the JEM-3200FS, by Indiana University in the US for studying viruses is symptomatic of the ever increasing need for structural information about viruses to aid in the drug discovery process.

October 11, 2007 (Cambridge, Mass.) -- Massachusetts Institute of Technology and the Consulate General of Japan in Boston hosted a seminar on Advanced Materials presented by Professor Akihisa Inoue, President of Tohoku University of Japan. Prof. Inoue addressed an audience of MIT materials science students and faculty, as well as representatives from JEOL USA who assisted with the event, in an MIT lecture hall on Wednesday, September 19th. Marking the occasion of Tohoku University’s 100th ...