JEOL USA Press Releases

August 2, 2007 (Peabody, Mass.) -- JEOL USA, a leading supplier of electron microscopes and scientific instruments for nanotechnology, announced today that it has completed installation and acceptance of its first thermal field emission electron microprobe in the United States. The microprobe was installed at NIST in Gaithersburg, Maryland, in one of the world’s most technically advanced laboratories for developing new technologies and standards for a wide range of nanotechnology fields. A fully-automated, high-throughput versatile ...

June 25, 2007 (Peabody, Mass.) -- JEOL USA has recently published the third edition of its popular AccuTOF-DART Direct Analysis in Real Time mass spectrometry applications notebook. The updated booklet contains new data on chemical reaction monitoring and detection of the peroxide explosives TATP and HMTD. A compilation of 28 applications notes describes analyses performed using the AccuTOFTM time-of-flight mass spectrometer with the DART® ion source. Samples analyzed include pharmaceuticals, illicit drugs, foods, flavors, fragrances, industrial ...

New ink sampling technique takes a bite out of time

July 10, 2007 (Peabody, Mass.) -- JEOL USA has introduced a new high resolution direct write e-beam lithography system to complement its family of spot beam, vector scan systems and mask production tools. The new JBX-5500FS direct write lithography tool writes patterns at a minimum line width of 10nm at 50kV on up to 100mm substrates. The PC-controlled operating platform features a simple graphical user interface (GUI) for pattern design and machine control. Complete line of ...

JEOL USA (Peabody, Mass.) today announced a direct-write e-beam lithography system targeted at research labs and universities. The JBX-5500FS system is capable of 10 nm resolution at 50 kV on silicon pieces or wafers up to 100 mm.

A team of researchers from the Department of Energy's Lawrence Berkeley National Laboratory, Purdue University and Hysitron Inc. in Minneapolis are using special instrumentation with the JEOL 3010 in situ transmission electron microscope to correlate high-resolution load-displacement measurements with individual video frames, showing how nanoscale volumes of aluminum deform under stress from a diamond "nanoindenter".

A new frontier on the head of a pin: Nanotechnology Institute at University of Alberta, Canada will explore new kinds of matter.

May 8, 2007 (Peabody, Mass.) -- For the seventh consecutive year, JEOL USA, Inc., a leader in the manufacture, sales, and service of electron microscopes and analytical instruments, has received the Omega NorthFace Scoreboard Award in recognition for its commitment to providing exemplary service and exceeding customer expectations. “We at JEOL are proud of our continuous and measurable improvement over the years,” said Patrick McGinley, Director of Service. “Supplying excellent service requires a corporate-wide commitment ...

The University of York has taken a significant step into new fields of sub-Angstrom level materials research with the opening of the York JEOL Nanocentre. The interdisciplinary research and teaching centre represents a £5.5 million investment in novel nanoscience capability by the University of York, regional development agency, Yorkshire Forward, the European Union, and by scientific instruments supplier JEOL.

April 26, 2007 (Peabody, Mass.) -- JEOL USA announced today that researchers at Harvard University’s Department of Molecular and Cellular Biology have selected JEOL as a partner in a collaborative effort to map the brain using high resolution SEM images. Harvard biologist Professor Jeff Lichtman, post-doctorate Narayanan (Bobby) Kasthuri, and University of Southern California Research Assistant Kenneth Hayworth plan to use a JEOL scanning electron microscope (SEM) to ultimately produce a 3D image of ...