JEOL USA Press Releases

November 9, 2006 (Peabody, Mass.) -- JEOL USA introduces the latest in imaging technology and microscopy automation with its new 120 kV high resolution Transmission Electron Microscope (TEM). This versatile instrument, the model JEM-1400, is optimized for biological, polymer, and materials research, combining both imaging and cryomicroscopy excellence. High contrast resolution is assured at 0.38nm point-to-point and 0.2nm lattice images. The TEM can be quickly configured for either high contrast imaging or scanning transmission electron ...

November 9, 2006 (Peabody, Mass.) -- JEOL USA announced that it will deliver the first of its new 120kV Transmission Electron Microscopes (TEMs) to Georgia Institute of Technology in January 2007. The JEOL JEM-1400 is a versatile, compact TEM, optimized for biological, polymer, and materials research and designed for Cryo-EM applications. The TEM will be in operation at Georgia Tech’s School of Biology in the Cherry Emerson Building until it can be moved to the ...

August 9, 2006, Peabody, Mass. -- A new technical paper describes the use of direct analysis in real time (AccuTOF-DART™) mass spectrometry for rapid screening and analysis of counterfeit drugs. In order to chemically fingerprint counterfeit anti-malarial drugs, Prof. Facundo Fernandez’ bioanalytical chemistry lab at Georgia Tech conducts experiments using novel mass spectrometry techniques. A newly-published paper, authored by Fernandez, et al., describes the use of ambient mass spectrometry ion sources for open air, high ...

August 7, 2006, Peabody, Mass. -- A new technical paper describes the use of direct analysis in real time (AccuTOF-DART™) mass spectrometry for writing ink analysis performed for forensic applications. Analysis of writing inks to authenticate documents is described in the Journal of Forensic Science, July 2006, Vol. 51, No. 4, pages 915-918 in “Differentiating Writing Inks Using Direct Analysis in Real Time Mass Spectrometry.” Authored by Drs. Roger Jones and John McClelland of the ...

Peabody, Mass., July 25, 2006 -- JEOL USA, the industry-leading supplier of electron microscopes, has installed a model JEM-2100 LaB6 Transmission Electron Microscope (TEM) at Oklahoma State University’s new microscopy service laboratory. The lab, which will serve researchers from both the university and neighboring industry, hosted an open house to introduce their expanded facilities and services, including the cryogenic capabilities of the new TEM. Professor’s Dream Realized The new lab is the vision of an ...

Peabody, Mass., June 26, 2006 -- JEOL USA has installed two transmission electron microscopes (TEMs) at the University of Texas Medical Branch’s (UTMB) newly-opened Cryo-electron Microscopy Center for Macromolecular Systems in Galveston, Texas. This facility contains the W. M. Keck Center for Virus Imaging, the first biosafety level 3 (BSL3) laboratory to house a cryo-electron microscope for high-resolution studies of deadly viruses and human pathogens. These research tools will enhance UTMB’s frontline research capabilities in ...

June 2006, Peabody, MA -- For the sixth consecutive year, JEOL USA, Inc., a leader in the manufacture, sales, and service of electron microscopes and analytical instruments, has received the Omega Northface Award in recognition for its commitment to providing exemplary service and exceeding customer expectations. Through quarterly surveys of more than 150 JEOL customers, selected randomly, Omega Management Group computed JEOL’s customer satisfaction scores in the categories of technical support, field service, account ...

Peabody, Mass., May 19, 2006 -- JEOL, the leading manufacturer of e-beam lithography tools since 1967, announces the introduction of a new high precision direct write e-beam lithography system. The new JBX-6300FS is a spot beam, vector scan, step and repeat lithography system designed for high volume direct patterning on wafers, and is capable of writing minimum line widths of 8nm. 2-inch to 200mm wafers can be accommodated, as well as parts and pieces. ...

Peabody, Mass., May 19, 2006 --  JEOL, the industry-leading manufacturer of high resolution Scanning Electron Microscopes (SEMs), will showcase its automated, 360 degree wafer edge review SEM in Booth 1101 in the South Hall at Semicon West 2006, Moscone Center, San Francisco. The JEOL JWS-2000 (200mm) and JWS-3000 (200/300mm) are the only wafer edge review SEMs that allow pinpoint inspection at any position on the circumference of the 200mm or 300mm wafer. A unique high ...

Peabody, Mass., May 17, 2006 --  JEOL USA, a leading manufacturer of electron microscopes and analytical instruments, introduces a new ultra-high resolution Field Emission Scanning Electron Microscope (SEM) with advanced optics that clearly reveal intricate surface details during observation of nano structures of medical, biological, materials science, and semiconductor samples. Unique in-lens performance with semi-in lens advantages The performance and stability of the new JSM-7500F allows specimens to be easily observed at magnifications up to ...