JEOL USA Press Releases

March 7, 2016 (Pittcon 2016, Atlanta GA) -- JEOL USA (Booth #2857) will unveil several new analytical technologies during Pittcon 2016 in Atlanta, Georgia. With a comprehensive line of time-of-flight mass spectrometers, high resolution scanning (SEM) and transmission (TEM) electron microscopes, and the latest in 2-channel and digital/high frequency Nuclear Magnetic Resonance Spectrometry, JEOL helps advance imaging and analytical capabilities across a wide range of scientific research. Real-time gas analysis with InfiTOF JEOL will debut the ...

March 9, 2015 Peabody, MA -- The JEOL AccuTOF-GCx will be exhibited for the first time in the U.S. at Pittcon 2015 in New Orleans, booth #1523. The AccuTOF-GCx, the fourth generation of JEOL’s successful gas chromatography/time-of-flight mass spectrometer systems, is designed for optimum throughput, operation, and uptime. It offers improved resolution, accuracy, and sensitivity, while retaining the power and flexibility of the previous models. In combination with comprehensive 2D gas chromatography (GCxGC) using ...

March 9, 2015 (Pittcon, New Orleans) -- JEOL is proud to celebrate the 10th anniversary of the introduction of the enormously popular AccuTOF-DART® ambient ionization mass spectrometer by introducing the new AccuTOF-DART®4G at Pittcon 2015, with new performance capabilities including enhanced resolution, speed, and accuracy in a rugged, flexible, versatile design. The AccuTOF-DART 4G couples the facile operation of the DART (Direct Analysis in Real Time) ion source with the high-resolution, accurate mass capability ...

February 19, 2015, Peabody, MA -- With the increased frequency in the use of improvised explosive devices (IEDs), there is a growing need for crime scene investigators to rapidly detect minute traces of explosive materials as well as link the devices to a person of interest. Whenever a latent fingerprint is found at the scene, most analytical techniques would involve use of a swab to take a sample, destroying the fingerprint in the process, ...

March 6, Peabody, Mass. -- JEOL USA has launched an imaging contest to showcase some of the best work of users of its electron microscopes. A winning image will be selected for each month of 2014, judged by JEOL's SEM and TEM applications teams for their technical and artistic qualities. "Many customers have asked us about launching an image contest, so we decided to do just that starting this year. JEOL SEM and TEM users ...

Peabody, Mass., October 15, 2008 – Two of JEOL’s top-of-the-line cryo-electron microscopes will be key instrumentation for multi-disciplinary scientific advances in a new $1 billion research center in Kannapolis, North Carolina. The David H. Murdock Research Institute (DHMRI) has selected JEOL’s high resolution electron microscopes for its world-class laboratory, which will serve as a central resource to multiple university research institutes and private companies. The vision and impetus behind this collaborative research institute is that ...