JEOL Announces New Field Emission Scanning Electron Microscope
(June 1, 2017 - Peabody, Mass.) – JEOL USA, Inc. introduces its new premier Field Emission SEM, the JSM-7900F, a uniquely flexible platform that combines the ultimate in high resolution imaging with unparalleled nano scale microanalysis. This tool excels in lightning fast data acquisition through simple and automated operation. Applications include imaging and analysis of metals, magnetic materials, semiconductors, ceramics, medical devices, and biological specimens.
Advanced research and analysis requires ever more powerful capabilities in a flexible, ...