JEOL USA Press Releases

(April 25, 2017, Peabody, Mass.) JEOL, a global leader in scanning electron microscopy (SEM) for imaging and analysis, will exhibit its popular InTouchScope series SEM at Ceramics Expo in Cleveland, OH on April 25-27. From surface observation to cross-section imaging and analysis, JEOL Scanning Electron Microscopes and ion beam polishers reveal structural and elemental details to ensure the quality and composition of materials. JEOL instruments make it possible to examine the inner structure and core ...

(March 1, 2017, Peabody, MA) -- With the introduction of the ROYAL HFX probe for Nuclear Magnetic Resonance (NMR) Spectroscopy, JEOL offers a new level of flexibility for NMR analysis of fluorinated compounds prevalent in many new pharmaceutical products.  The ROYAL HFX is the world's first liquid NMR probe with the capability to automatically switch between single tune and dual tune modes on the high frequency coil without compromising single tune performance. The probe can ...

June 2, 2016 (Peabody, Mass.) -- JEOL USA will unveil several new analytical technologies during ASMS 2016 in San Antonio, Texas (Booth #229). With a comprehensive line of time-of-flight mass spectrometers, JEOL advances analytical capabilities for a wide range of scientific research. JEOL and the company's mass spectrometry customers will present several posters at ASMS. In particular, one oral presentation by collaborators at University at Albany will detail the use of AccuTOF-DART for "Classification of ...

March 24, 2016 Peabody, MA -- JEOL is honored to announce that the company founders were recognized for their scientific vision and pioneering leadership at Pittcon 2016 in Atlanta, Georgia. President and CEO of the Chemical Heritage Foundation, Carsten Reinhardt, presented the Pittcon Heritage Award to JEOL Ltd. President Gon-emon Kurihara at a special ceremony on Sunday, March 6. President and CEO of the Chemical Heritage Foundation, Carsten Reinhardt (left), presented the Pittcon Heritage Award ...

March 7, 2016 (Pittcon 2016, Atlanta GA) -- JEOL USA (Booth #2857) will unveil several new analytical technologies during Pittcon 2016 in Atlanta, Georgia. With a comprehensive line of time-of-flight mass spectrometers, high resolution scanning (SEM) and transmission (TEM) electron microscopes, and the latest in 2-channel and digital/high frequency Nuclear Magnetic Resonance Spectrometry, JEOL helps advance imaging and analytical capabilities across a wide range of scientific research. Real-time gas analysis with InfiTOF JEOL will debut the ...

March 7, 2016 (Pittcon 2016, Atlanta, GA) -- At Pittcon 2016 (booth #2857), JEOL will debut the new InfiTOF, a compact high-resolution mass spectrometer designed for real-time gas analysis. The InfiTOF’s unique multi-turn ion optics provide high-resolution mass spectra in a system that is the size of a personal computer tower. Featuring a mass resolving power of up to 30,000, the InfiTOF can easily separate isobaric species such as CO+ and N¬2+ without chromatography. ...

March 7, 2016 (Pittcon 2016, Atlanta, GA) – JEOL introduces a new combination electron ionization/photoionization (EI/PI) source for JEOL’s fourth-generation AccuTOF-GCX high-resolution time-of-flight mass spectrometer. The new EI/PI source complements the dedicated electron ionization (EI), positive/negative chemical ionization (CI), field desorption/field ionization (FD/FI) and combination EI/FI/FD ion sources and direct probes that make the GCX the most versatile GC/TOF and GCxGC/TOF system available. Much like field ionization, photoionization is a soft ionization method that ...

March 7, 2016 (Pittcon 2016, Atlanta, GA) -- At Pittcon 2016 (Booth #2857) JEOL will demonstrate the latest features of the game-changing open air ambient ionization mass spectrometer system. This third-generation AccuTOFTM-DART® 4G couples the facile operation of the DART (Direct Analysis in Real Time) ion source with the high-resolution, accurate mass capability of the AccuTOF time-of-flight mass spectrometer. Not only can the user rapidly acquire data for mixtures and complete unknowns without sample ...

March 7, 2016 (Pittcon 2016, Atlanta, Georgia) --- JEOL introduces a new benchtop SEM at Pittcon 2016: the JSM-6000Plus, the third generation of the popular NeoScope. The NeoScope delivers fast, high magnification electron microscopy with more functionality than typical benchtop SEMs. The JSM-6000Plus model offers high sensitivity backscatter electron detection with a JEOL BSE detector to detect contrast between areas of the sample with different chemical compositions. JEOL's benchtop SEM makes it possible to bring ...

March 7, 2016 (Pittcon 2016 Atlanta, GA) -- JEOL will demonstrate its high resolution analytical Scanning Electron Microscope in Booth #2857 during the week of Pittcon 2016. The JSM-IT300LV Scanning Electron Microscope is a versatile research grade SEM for high throughput imaging and microanalysis. A highly-customizable SEM, the JSM-IT300LV features smart analytical port geometry for multiple configurations allowing simultaneous analysis techniques. It can be outfitted for 10 or more analytical attachments including: energy dispersive ...