August 11, 2009 (Peabody, Mass.) -- JEOL, a leading supplier of high resolution, high performance Scanning Electron Microscopes (SEM) and atomic resolution Transmission Electron Microscopes (TEM), has developed two new publications that explain theory and operation of the SEM for routine imaging and elemental analysis.
These two new books can be downloaded from the JEOL USA website (jeolusa.com) under the Resources tab. They are a useful resource for novice users of SEM or anyone teaching basic SEM operation.
“SEM: Scanning Electron Microscope A to Z – Basic Knowledge for Using the SEM,” explains basic principals of operation, image display, the role of secondary and backscattered electron detectors, and the vacuum system. Further explanation of the SEM includes edge effect, the influence of accelerating voltage, the illumination effect of secondary and backscatter electron detectors, techniques for improving image resolution, benefits of different types of electron guns, elemental analysis, and sample preparation.
“SEM Q&A,” answers specific questions most often asked during demonstrations and training: how to mount powder samples, selecting the accelerating voltage, stereoscopic observation techniques, and more.
These documents replace two popular, long-standing JEOL books, “A Guide to Scanning” and “Introduction to the SEM World.”
For 60 years, JEOL has been a global resource for advanced electron microscope technology, applications development, and training. Through comprehensive hands-on training courses at the JEOL Institute, headquartered at JEOL USA in Peabody, Massachusetts, JEOL customers learn operating functions and applications of the instrument to their specific area of interest. In 2009, JEOL and the College of Microscopy, the educational arm of McCrone, created a partnership that ensures expert, real world instruction for college students pursuing related degrees, and hands-on training in the field of microscopy.