JEOL is proud to announce the JEM-Z200MF, a state-of-the-art scanning/transmission electron microscope (S/TEM) designed for atomic resolution imaging in a magnetic field-free environment. The MARS (Magnetic field-free Atomic Resolution imaging System) enables high resolution observation without applying strong magnetic field to specimen.
This observation method is expected to become a groundbreaking tool that will significantly advance cutting-edge material research and development in fields such as magnets, steel, semiconductor devices, and quantum technology.
Recently highlighted in a study by the University of Tokyo and published in Nature Communications, the MARS was instrumental in visualizing space charge layers across grain boundaries in fuel cell solid electrolytes. This discovery underscores the system’s potential to advance research in battery materials and beyond.
Magnetic Field-Free Objective Lens with High-Resolution Imaging
The MARS is equipped with a magnetic field-free objective lens, allowing unparalleled resolution without the influence of strong magnetic fields on specimens. This innovative design integrates two opposing lenses to create a magnetic field-free sample environment, enhancing stability and reducing chromatic aberration. Combined with a higher-order aberration corrector, the system achieves atomic resolution imaging.
Key features include:
| Double Delta Corrector: |
Available Image- and Probe-side aberration correctors create an optical system that is free of all geometric aberrations up to fifth order, including six-fold astigmatism. |
| Illumination System: |
Offers modes for both high-resolution imaging and high-sensitivity Differential Phase Contrast (DPC) investigations. |
| Flexible Imaging Modes: |
Switch seamlessly between Conventional (CV) Mode for bright and dark field imaging and High-Resolution (HR) Mode with the press of a button. |
| Tilt-Scan System: |
This dedicated beam deflection system enables clearer visualization of specimen substructures (e.g., domain boundaries) during DPC by reducing diffraction contrast effects. |
Why Choose the JEM-Z200MF?
The MARS represents the height of magnetic field-free electron microscopy. Its high-resolution capabilities and design empower researchers to push the boundaries of discovery with precision and clarity.
Explore how the revolutionary MARS S/TEM can transform your research. Contact JEOL USA to learn more about this groundbreaking instrument.