January 20, 2025, Peabody, MA. JEOL USA announces the release of its new broad ion beam milling instruments, Cross Section Polisher™ (CP) and Cooling Cross Section Polisher™ (CCP). These instruments are widely used for preparing high quality, artifact-free cross sections for imaging and microanalysis by SEM, EPMA or Auger.
These new configurations have an improved High Speed Milling Source for ultra-fast milling rates, up to 1.2mm/h. A new flow-chart style control panel guides the user for quick easy setup. Now remote enabled for access and control through a web browser, monitoring and adjusting the milling process is possible from anywhere when connected to a LAN.
Upgraded configurations include air-isolated transfer workflows for reactive specimens, wide area milling (up to 8mm or more), surface milling and sputter coating.
JEOL has been a leader in the field of ion beam specimen preparation with over 2000 units sold since its launch in 2003. JEOL’s Cross Section Polishers™ are widely used in the fields of electronics/semiconductor, ceramics, metallurgy, battery, polymer and life science. The CPs produce pristine cross sections of the most challenging specimens: brittle materials, multilayer coatings, fragile-porous materials, polymers and composites etc. Contact JEOL to learn more about these innovative tools to meet your specimen preparation challenges.