September 20, 2010 (Peabody, MA) -- JEOL announces a major order for the company's atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM), from the National Institute of Standards and Technology (NIST). The purchase was made through a competitive award process and funded by the American Recovery and Reinvestment Act. The TEM will be a featured instrument in the NIST Precision Measurement Laboratory, Boulder, Colorado.
"We are very excited to be partnering with this premier Federal government facility and are confident the opportunity will recognize the high performance capability of this new TEM platform," said Peter Genovese, JEOL USA President. “We believe having hands-on access will open up unexplored horizons and world-class results for the scientific team who will be using it.”
The ARM200F, introduced in 2009, has set a new benchmark for advanced aberration-corrected S/TEM technology with the highest resolution (78pm) commercially available in its class. The instrument represents more than 60 years of TEM expertise at JEOL and was designed from the ground up to integrate aberration correction into a super-shielded electron column that safeguards the ultrahigh-powered optics from environmental interferences.