The JSM-IT810 series Ultrahigh Resolution FE SEM made its debut at the Microscopy and Microanalysis 2024 conference in late July. This debut included live demonstrations for those in the market for an analytical ultrahigh resolution FE SEM.
This new platform is where versatility meets high spatial resolution and ease-of-use with the next level in JEOL’s intelligent technology for imaging and analysis at the nanoscale. Powerful software with automation built-in, enables seamless acquisition of data from observation to elemental analysis and reporting.
The JEOL NEOENGINE® electron beam control system and advanced auto functions provide fast and clear transitions from high resolution imaging to high current analysis without sacrificing performance. Capabilities include up to 2,000,000X magnification and accelerating voltage range from 0.01 to 30kV making it possible to acquire outstanding detail of nanomaterials or biological nanostructures.
New No-Code automation workflows come standard and make it very easy to achieve high throughput results. It is possible to automate the collection of images and analyses under multiple beam settings, positions and detectors without user intervention. Enhance efficiency and productivity with these new automation routines.
Equip with JEOL’s embedded Live EDS allows for direct monitoring of chemical composition during imaging.
Novel segmented detector options are available for Live 3D surface reconstruction for enhanced viewing of complex surfaces.
To experience the new capabilities or explore solutions that meet your work, customers are invited to contact JEOL USA.