JEOL USA is proud to share the publication of research by The University of Tokyo in Nature Reviews Electrical Engineering, showcasing the advanced capabilities of the JEOL MARS (Magnetic field-free Atomic Resolution imaging System).
This research highlights how advanced DPC STEM is revolutionizing the nanoscale imaging of electromagnetic fields in state-of-the-art electronic and spintronic devices, paving the way for innovative breakthroughs in materials science, "We emphasize the immense potential of advanced DPC STEM for the research and development of future electronic and spintronic devices".
Nanoscale electromagnetic field imaging by advanced differential phase-contrast STEM
Congratulations to authors Satoko Toyama, Takehito Seki, Yuji Kohno, Yoshiki O. Murakami, Yuichi Ikuhara and Naoya Shibata! At JEOL USA, we are committed to driving innovation and empowering researchers to achieve groundbreaking discoveries. To learn more about how the MARS can advance your laboratory's research, contact your local sales representative today.