JEOL USA Press Releases

JEOL is pleased to announce the introduction of a new CRYO-FIB-SEM, a Focused Ion Beam milling specimen preparation tool specifically designed for creating thin, frozen samples for Cryo-Electron Microscopy. The new system complements JEOL’s existing Cryo-TEM technology and provides a comprehensive solution for preparing and imaging vitreous frozen biological and biopolymer samples to be observed in the CRYO ARM 200 and CRYO ARM 300II Transmission Electron Microscopes.  JEOL’s CRYO-FIB-SEM incorporates a liquid nitrogen cooling stage ...

February 1, 2023 – Peabody, MA JEOL has developed a new Focused Ion Beam (FIB) solution for preparation of specimens prior to observation in the Transmission Electron Microscope (TEM). The new JIB-PS500i is a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument. High Quality Fast TEM Sample Preparation The new FIB sample stage offers fast transitioning between processing and imaging, allowing for real-time feedback of specimen ...