Gather-X Windowless EDS

Gather-X Windowless EDS for higher sensitivity and low-energy X-Ray detection down to Lithium

Gather-X Windowless EDS

Gather-X, a new Windowless EDS from JEOL, answers the need for higher sensitivity and low-energy X-Ray detection.

The new 100mm 2 windowless EDS can collect the entire X-ray range produced from the IT800 series FE SEMs including low-energy X-rays down to Lithium. With its novel racetrack design and fully integrated and interlocked controls, collection as short as 2mm working distance will provide clear, high count rate EDS maps with high spatial resolution.

Gather-X is fully embedded in our latest SEM Center software interface with Live Analysis and can also be run in combination with multiple JEOL EDS detectors.

Key Features

Detection of Characteristic X-rays less than 100eV Down to Lithium

Improved detection sensitivity for characteristic X-rays less than 1 keV and the ability to detect soft X-ray regions less than 100eV (down to Li-K).

Large Solid Angle

The large solid angle and windowless design provide higher count rates allowing for fast collection times, minimizing potential beam damage with sensitive specimens.

Analysis at High kV - Up to 30keV Beam

EDS data can be collected normal analysis conditions with no damage to the detector. The unique electron trap design enables collection of the entire EDS range at electron beam voltages up to 30kV.

Short Working Distance/Beam Deceleration Mode Analysis

Full integration into the new SEM Center operating system allows for safe operation at short working distances for high spatial resolution, low-energy conditions typical for ultrahigh resolution SEMs.

High Spatial Resolution

Improved sensitivity for light element detection allows for high count rate low kV analysis. The racetrack-shaped detector allows insertion at very short working distances while maintaining a large solid angle for efficient collection of high spatial resolution EDS maps.

Designed by JEOL Exclusively for JEOL SEMs

The JEOL IT810 series SEM with the addition of Gather-X is designed for unprecedented ease-of-use, high-sensitivity, and high spatial resolution for both imaging and analysis. Gather-X operation is embedded within the SEM Center software for Live (Real-Time) display of EDS spectrum or maps simultaneously with SEM imaging.
This smart-flexible-powerful Scanning Electron Microscope system delivers the highest level of intelligent technology for the most versatile high-resolution, analytical FE SEM available today.

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