The JSM-IT500 InTouchScope™ SEM Series offers Versatile Research Grade Scanning Electron Microscopes.
Smart – Flexible – Powerful
Smart – The latest innovations for our InTouchScope™ series SEMs are designed to make SEM accessible to everyone. All the controls are at your fingertips with an intuitive software interface. Seamless navigation across the sample allows you to quickly go from an optical image to high resolution SEM imaging and analysis.
Flexible –Choose a platform that is right for you. We offer high vacuum and low vacuum models with or without our embedded EDS system [JSM-IT500, JSM-IT500A, JSM-IT500LV, JSM-IT500LA]. This platform has a large sample chamber with multiple ports which are optimally positioned for analytical attachments such as: energy dispersive X-ray spectrometer (EDS), electron backscatter diffraction (EBSD), cathodoluminescence detectors (CL), wavelength dispersive X-ray spectrometer (WDS), chamberscopes, heating/cooling sub-stages, etc.
Powerful – High resolution W filament gun (LaB6 option) with unsurpassed low kV performance. Large analytical chamber and stage can cover samples as large as 178mm (d) by 80mm (h). The stage is mounted inside the chamber enabling users to secure large, heavy and odd shaped objects on the stage with clear positioning prior to evacuating the chamber. Our integrated color camera allows for intuitive navigation to the area of interest and our embedded EDS brings fast quantitative elemental characterization.
Our analytical series includes JEOL’s fully embedded EDS system which provides real time EDS spectra during image observation. With Live Analysis you can:
- View EDS spectra in real time as you search for the area of interest.
- Set analysis points, areas, map positions and line scans from the live image observation screen
- Major elements are displayed on the live image observation screen
- Set a color-coded alert for user-specified elements of interest.