EDM Basic (Electrostatic Dose Modulator)

EDM Basic (Electrostatic Dose Modulator)
The Electrostatic Dose Modulator (EDM) is a fast beam blanking system with a pre-sample electrostatic deflector, including electronics and software control. With EDM, the beam can switch on or off in less than 50 ns. This 100,000x improvement in blanking speed immediately improves the clarity of data taken at fast exposure times. EDM can also attenuate electron illumination without affecting imaging conditions, giving TEM and STEM users exceptional control over the dose on their samples. Cutting-edge electronics and software add-ons unlock advanced applications such as temporal dose structuring and STEM synchronization.

Features

  • Lightning-fast speeds:
    EDM systems achieve switching times faster than 50 ns.
  • Independent intensity adjustment:
    By rapidly turning the beam on and off with variable pulse widths, the EDM makes it easy to adjust the average beam intensity without changing the image conditions. A desktop accessory knob provides an intuitive interface to adjust the dose attenuation factor.
  • Dose structuring:
    Users can take control of their illumination by applying dose in pulses with variable durations as short as 100 ns and frequencies up to 1 MHz.
  • Modern control software:
    The EDM works out of the box as a fast beam blanker. Control software is included for programmable dose attenuation, logging, and more.
  • Integration:
    The EDM act as a fast reliable pre-sample beam blanker while supporting a companion Relativity Sub-Framing System as well as third-party hardware.

Pulsed beam TEM illumination

Pulsed beam TEM illumination

Pulsed beam STEM Illumination

Pulsed beam STEM Illumination
Dose attenuation by pulsed illumination with Frequency of 500 kHz (2 μs) in a high resolution STEM at 300 kV using Si[110] in the condition of pixel dwell time with 19 μs/pixel (1,024 x 1,024 pixels), by changing duration ration from 90% to 50% during acquisition of one STEM image in 20 s.

Specifications

Fast beam blanking

Quantity Value
Maximum pulse frequency 500 kHz
Transition time 90%-10% < 20 ns
Blanking signals 3 inputs

Dose attenuation

Configuration EDM Basic
Application TEM and STEM imaging
Pulse repetition frequency (max) 500 kHz
Pulse width increment 62.5 ns
Minimum pulse width 125 ns

EDM option

EDS True Area Scan EDM Programmable Scan with EDM Synchrony

Applicable models:

 JEM-ARM300F2, JEM-ARM200F (CFEG), NEOARM (CFEG), JEM-F200 (CFEG), JEM-2200FS*, JEM-2100F*, JEM-3300, JEM-Z200FSC, JEM-Z200CA
(* These models should be equipped with a standard column without the Cs corrector.)

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