JEOL, a world leader in SEM technology for six decades, offers scanning electron microscopes that enable imaging and analysis of the smallest details in forensic microscopy. JEOL SEMs are used for crime scene investigation, accident reconstruction, ballistics, explosives detection, toxicology, arson investigation, automated gun shot residue analysis, trace evidence, and failure analysis. The imaging and analytical ability of JEOL SEMs reveal physical and chemical evidence that might otherwise be easily overlooked.