Search
PRODUCTS
Transmission Electron Microscopes (TEM)
Scanning Electron Microscopes (SEM)
Microprobe (EPMA) and Auger
Sample Preparation Tools
Focused Ion Beam
Elemental Analysis
Mass Spectrometers
Nuclear Magnetic Resonance
Electron Spin Resonance
Photomask / Direct Write Lithography
Additive Manufacturing
Medical Equipment
Industrial Equipment
APPLICATIONS
Batteries
Ceramics
Chemistry
Drug Discovery
Energy
Environmental
Failure Analysis
Forensics
Geology Solutions
Life Sciences
Materials Science
Nanotechnology
Pharma NMR
Semiconductor
Application List by Product
REALab Customer Stories
Yokogushi (Cross-Platform Analysis)
RESOURCES
Electron Optics
Mass Spectrometry
Nuclear Magnetic Resonance
Photomask / Direct Write Lithography
Sample Preparation
Additive Manufacturing
Webinars and Videos
Posters
JEOL Periodic Table App
JEOL MS Calculator App
Scanning Electron Microscopy Basics
Mass Spectrometry Basics
NMR Basics
Financing
SERVICE / SUPPORT
JEOL USA Service & Support
Offered Services
Service Level Agreements
Environmental Remediation
Request Service
Parts Center
Instrument Training
NEWS & EVENTS
Blog
Press Releases
JEOL in the News
Events and Trade Shows
JEOL USA Image Contest
JEOL NEWS Magazine
JEOL Newsletters
ABOUT US
The Company
Milestones
Management Team
FAQ
Corporate Benefits
Current Career Opportunities
Submit Application
Social Governance Statement
CONTACT US
Contact Us
Find a Local Sales Rep
Direction to JEOL USA
Request Product Info
Find a Local Service Office
JEOL Regional Websites
PRODUCTS
Scanning Electron Microscopes (SEM)
HV/LV Tungsten/LaB6 SEMs
JSM-IT210
JSM-IT510
High-Res, Large-Chamber SEM
JSM-IT710HR
Benchtop
NeoScope Benchtop SEM
FE SEM
JSM-IT810
SEM-FIB
JIB-4700F / MultiBeam
JIB-4000 / MultiBeam
Elemental Analysis
Transmission Electron Microscopes (TEM)
120 kV
JEM-120i
200 kV
NEOARM
Monochromated ARM200F
JEM-F200 F2
JEM-2100Plus
CRYO ARM™ 200
JEM-ACE200F
JEM-Z200MF
300 kV
JEM-ARM300F2
CRYO ARM™ 300 II
Analytical & Data Optimization
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
TEMPO
PULSE System
Environmental Control Solutions
Focused Ion Beam
CRYO-FIB-SEM
JIB-PS500i
JIB-4700F
Sample Preparation Tools
Cross Section Polisher
Vacuum Evaporator
Smart Coater
Carbon Coater
UV Cleaner
Auto Fine Coater
Nuclear Magnetic Resonance
JNM-ECZL series FT NMR
Probes
ROYALPROBE
ROYALPROBE HFX
Cryogenic Probes for NMR
Liquids/Solution State Probes
AutoMAS Solids Probe
HCN MAS and HXY NMR Probes
Solid State NMR Probes
NMR Probe Key Features and Applications
Delta NMR Software
CRAFT for Delta
NMR in pharma
qNMR
Magnets
Sample Changers
Cryogen Reclamation System
Electron Spin Resonance
JES-X330
JES-X320
JES-X310
Mass Spectrometers
AccuTOF DART
AccuTOF DART Technology
AccuTOF DART Ionization Mechanisms
AccuTOF Time-of-Flight Mass Analyzer
AccuTOF DART High-Resolution Accurate Mass
AccuTOF GC-Alpha
msFineAnalysis AI
AccuTOF GCxGC MS
AccuTOF LC-Express
GC/Single-Quadrupole Mass Spectrometer
NETZSCH And JEOL
msFineAnalysis iQ
GC/Triple-Quadrupole Mass Spectrometer
msFineAnalysis iQ
MALDI SpiralTOF TOF/TOF
msRepeatFinder Polymer Analysis Software
MALDI Imaging SpiralTOF
UltraFOCUS DIOXIN Analysis
Microprobe (EPMA) and Auger
JXA-iHP200F
JXA-iSP100
JAMP-9510F
Soft X-Ray Emission Spectrometers
Photomask / Direct Write Lithography
Electron Beam Lithography
JBX-A9
JBX-8100FS
JBX-3050MV
Elemental Analysis
Embedded EDS for SEM
Gather-X Windowless EDS
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S XRF
Correlative Microscopy Solutions
Additive Manufacturing 3D Printer
Medical Equipment
BioMajesty Series
JCA-6010/C
JCA-BM 6050
JCA-9130/C
JCA-BM 2250
JCA-BM 8000 Series
Industrial Equipment
High-Power Electron Beam Sources
Electron Beam Sources
BS-60050EBS Electron Beam Source
EB Source Power Supply
Plasma Source
Rotary Sensor
APPLICATIONS
Application List
Battery Materials
Ceramics
Chemistry
Energy
Failure Analysis
Forensics
Geology Solutions
Life Sciences
Materials Science
Nanotechnology
Semiconductor
SEE MORE HERE
Application List By Product
SEM Applications
TEM Applications
NMR Applications
FIB Applications
Mass Spec Applications
Sample Prep Applications
REALab Customer Stories
Center for Biologic Imaging at University of Pittsburgh
Lake Superior State University
Yokogushi (Cross-Platform Analysis)
RESOURCES
Electron Optics
Documents & Downloads
Image Gallery
FAQs
Links & Resources
Videos
Scanning Electron Microscopy Basics
Analytical Instruments
Documents & Downloads
Walkup NMR
Reference Data
Tutorials (Mass Spec)
Tutorials (NMR)
No-D NMR
Non Uniform Sampling (NUS)
Mass Spectrometry Basics
NMR Basics
NMR Magnet Destruction
Photomask / Direct Write Lithography
Documents & Downloads
Sample Preparation
Documents & Downloads
Image Gallery
Additive Manufacturing
Webinars and Videos
Posters
JEOL Periodic Table App
JEOL MS Calculator App
Financing
SERVICE / SUPPORT
JEOL USA Service & Support
Request Service
Offered Services
Service Level Agreements
Instrument Training
SEM/TEM Training
NMR Training
Mass Spectrometry Training
Parts Center
Purchase
Request for Quotation
General Inquiry
NEWS & EVENTS
Blog
Press Releases
JEOL in the News
Events & Shows
JEOL USA Image Contest
2024 Entries & Winners
2023 Entries & Winners
2022 Entries & Winners
2021 Entries & Winners
2020 Entries & Winners
2019 Entries & Winners
2018 Entries & Winners
2017 Entries & Winners
2016 Entries & Winners
2015 Entries & Winners
2014 Entries & Winners
NeoScope Image Contest
JEOL USA Image Contest Entry Form
JEOL NEWS Magazine
JEOL Newsletters
JEOLink Newsletter
Mass Media Newsletter
JEOLink NMR Newsletter
ABOUT US
The Company
Career Opportunities
Corporate Benefits
Current Career Opportunities
Submit Application
Milestones
Management Team
FAQs
CONTACT US
JEOL USA Headquarters
JEOL Regional Web Sites
Find a Local Sales Rep
Additive Manufacturing
EB Lithography (Direct Write)
Electron Microscopy
ESR, NMR, Mass Spectrometry
Find a Local Service Office
Electron Microscopy / EB Lithography
ESR, NMR, Mass Spectrometry Instruments Service
Request Product Info
Directions to JEOL USA
PRODUCTS
Scanning Electron Microscopes (SEM)
HV/LV Tungsten/LaB6 SEMs
JSM-IT210
JSM-IT510
High-Res, Large-Chamber SEM
JSM-IT710HR
Benchtop
NeoScope Benchtop SEM
FE SEM
JSM-IT810
SEM-FIB
JIB-4700F / MultiBeam
JIB-4000 / MultiBeam
Elemental Analysis
Transmission Electron Microscopes (TEM)
120 kV
JEM-120i
200 kV
NEOARM
Monochromated ARM200F
JEM-F200 F2
JEM-2100Plus
CRYO ARM™ 200
JEM-ACE200F
JEM-Z200MF
300 kV
JEM-ARM300F2
CRYO ARM™ 300 II
Analytical & Data Optimization
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
TEMPO
PULSE System
Environmental Control Solutions
Focused Ion Beam
CRYO-FIB-SEM
JIB-PS500i
JIB-4700F
Sample Preparation Tools
Cross Section Polisher
Vacuum Evaporator
Smart Coater
Carbon Coater
UV Cleaner
Auto Fine Coater
Nuclear Magnetic Resonance
JNM-ECZL series FT NMR
Probes
ROYALPROBE
ROYALPROBE HFX
Cryogenic Probes for NMR
Liquids/Solution State Probes
AutoMAS Solids Probe
HCN MAS and HXY NMR Probes
Solid State NMR Probes
NMR Probe Key Features and Applications
Delta NMR Software
CRAFT for Delta
NMR in pharma
qNMR
Magnets
Sample Changers
Cryogen Reclamation System
Electron Spin Resonance
JES-X330
JES-X320
JES-X310
Mass Spectrometers
AccuTOF DART
AccuTOF DART Technology
AccuTOF DART Ionization Mechanisms
AccuTOF Time-of-Flight Mass Analyzer
AccuTOF DART High-Resolution Accurate Mass
AccuTOF GC-Alpha
msFineAnalysis AI
AccuTOF GCxGC MS
AccuTOF LC-Express
GC/Single-Quadrupole Mass Spectrometer
NETZSCH And JEOL
msFineAnalysis iQ
GC/Triple-Quadrupole Mass Spectrometer
msFineAnalysis iQ
MALDI SpiralTOF TOF/TOF
msRepeatFinder Polymer Analysis Software
MALDI Imaging SpiralTOF
UltraFOCUS DIOXIN Analysis
Microprobe (EPMA) and Auger
JXA-iHP200F
JXA-iSP100
JAMP-9510F
Soft X-Ray Emission Spectrometers
Photomask / Direct Write Lithography
Electron Beam Lithography
JBX-A9
JBX-8100FS
JBX-3050MV
Elemental Analysis
Embedded EDS for SEM
Gather-X Windowless EDS
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S XRF
Correlative Microscopy Solutions
Additive Manufacturing 3D Printer
Medical Equipment
BioMajesty Series
JCA-6010/C
JCA-BM 6050
JCA-9130/C
JCA-BM 2250
JCA-BM 8000 Series
Industrial Equipment
High-Power Electron Beam Sources
Electron Beam Sources
BS-60050EBS Electron Beam Source
EB Source Power Supply
Plasma Source
Rotary Sensor
APPLICATIONS
Application List
Battery Materials
Ceramics
Chemistry
Energy
Failure Analysis
Forensics
Geology Solutions
Life Sciences
Materials Science
Nanotechnology
Semiconductor
SEE MORE HERE
Application List By Product
SEM Applications
TEM Applications
NMR Applications
FIB Applications
Mass Spec Applications
Sample Prep Applications
REALab Customer Stories
Center for Biologic Imaging at University of Pittsburgh
Lake Superior State University
Yokogushi (Cross-Platform Analysis)
RESOURCES
Electron Optics
Documents & Downloads
Image Gallery
FAQs
Links & Resources
Videos
Scanning Electron Microscopy Basics
Analytical Instruments
Documents & Downloads
Walkup NMR
Reference Data
Tutorials (Mass Spec)
Tutorials (NMR)
No-D NMR
Non Uniform Sampling (NUS)
Mass Spectrometry Basics
NMR Basics
NMR Magnet Destruction
Photomask / Direct Write Lithography
Documents & Downloads
Sample Preparation
Documents & Downloads
Image Gallery
Additive Manufacturing
Webinars and Videos
Posters
JEOL Periodic Table App
JEOL MS Calculator App
Financing
SERVICE / SUPPORT
JEOL USA Service & Support
Request Service
Offered Services
Service Level Agreements
Instrument Training
SEM/TEM Training
NMR Training
Mass Spectrometry Training
Parts Center
Purchase
Request for Quotation
General Inquiry
NEWS & EVENTS
Blog
Press Releases
JEOL in the News
Events & Shows
JEOL USA Image Contest
2024 Entries & Winners
2023 Entries & Winners
2022 Entries & Winners
2021 Entries & Winners
2020 Entries & Winners
2019 Entries & Winners
2018 Entries & Winners
2017 Entries & Winners
2016 Entries & Winners
2015 Entries & Winners
2014 Entries & Winners
NeoScope Image Contest
JEOL USA Image Contest Entry Form
JEOL NEWS Magazine
JEOL Newsletters
JEOLink Newsletter
Mass Media Newsletter
JEOLink NMR Newsletter
ABOUT US
The Company
Career Opportunities
Corporate Benefits
Current Career Opportunities
Submit Application
Milestones
Management Team
FAQs
CONTACT US
JEOL USA Headquarters
JEOL Regional Web Sites
Find a Local Sales Rep
Additive Manufacturing
EB Lithography (Direct Write)
Electron Microscopy
ESR, NMR, Mass Spectrometry
Find a Local Service Office
Electron Microscopy / EB Lithography
ESR, NMR, Mass Spectrometry Instruments Service
Request Product Info
Directions to JEOL USA
RESOURCES
Analytical Instruments
Documents & Downloads
Analytical Instrument Documents
Categories
Cross-platform Application Notes (7)
Electron Spin Resonance (ESR) (7)
ESR Peer-Reviewed Articles (2)
Mass Spectrometry (MS) (328)
Abstract (3)
MS Application Notes (263)
AccuTOF™ DART® (64)
1. Introduction (6)
2. Drug Analysis (4)
3. Food, Flavors, Fragrances (14)
4. Forensics (17)
5. Homeland Security (5)
6. Industrial Materials (10)
7. Organic Synthesis (3)
8. PaperSpray (3)
9. Miscellaneous (6)
AccuTOF™ GC (81)
msFineAnalysis AI (11)
Introduction (12)
GCxGC (15)
Materials (23)
Petroleum (15)
Environmental / Food (14)
AccuTOF™ LC (17)
GC Single-Quad MS (17)
msFineAnalysis IQ (4)
GC Triple-Quad MS (13)
GCmate™ (8)
MALDI Imaging (21)
MStation™ (1)
MALDI SpiralTOF™ (31)
MALDI SpiralTOF™-TOF (28)
Essay / Tutorial (9)
JEOL News Articles (6)
MS Product Brochures (19)
MS Peer-Reviewed Articles (24)
Reference Data (14)
Nuclear Magnetic Resonance (NMR) (100)
ROYALPROBE HFX (8)
NMR Applications (12)
Delta Tips & Tutorials (13)
Experimental Possibilities (13)
Gradient Shimming (2)
No-D NMR (No-Deuterium Proton NMR) (3)
Solid State NMR (14)
SuperCOOL Probe (3)
NMR Peer-Reviewed Articles (27)
NMR Product Brochures (4)
Yokogushi (Cross-platform Analysis) (13)
Tags
HOESY
msFineAnalysis
petroleum
Organometallic Compounds
Field Desorption
JEOL Resources
Documentation in support of your JEOL product.
DART Presentations at PittCon 2007
|
1 MIN READ
|
0
Comment
|
1043
|
February 22, 2020
|
AccuTOF™ DART®
,
Mass Spectrometry (MS)
|
DART Presentations at PittCon 2007
Attached Files
resources_ai/ms/DART Presentations at Pittcon 2007.pdf 17.66 KB
Showing
0
Comment
Comments are closed.
Other Resources
Walkup NMR
See how the Delta NMR software allows users to just "walk up" and start NMR experiments
Mass Spec Reference Data
View our page of useful molecular references for Mass Spec
Tutorials (Mass Spec)
Documents on the basics of mass spectrometry
Delta NMR software Tutorials
Videos on how to use the Delta NMR software
No-D NMR
Description of No-D NMR and how it can be used to eliminate the need for deuterated solvents
Non Uniform Sampling (NUS)
Description of how NUS is used to greatly reduce the time needed for running NMR experiments
NMR Basics
Overview of the Basics of NMR Theory
NMR Magnet Destruction
See our presentation of the slicing open of a JEOL Delta-GSX 270 MHz NMR Magnet
NMR Training
Basic Operations and System Management for JEOL NMR Users
Mass Spec Training
Learn more about spectrometer operation and maintenance, data collection and processing, and advanced MS software operation.
JEOLink NMR Newsletter
We publish and send out this NMR newsletter to our customers. They can also be viewed here.
Mass Media Newsletter
We publish and send out this Mass Spec newsletter to our customers. They can also be viewed here.
Sales
Service
Inquiry
JEOL USA Headquarters
Find a Local Sales Rep
Find a Local Service Office
Request Product Info
Request Service
Directions to JEOL USA
JEOL Regional Web Sites
Products
Applications
Resources
Service / Support
News & Events
About Us
Contact Us
JEOL USA, Inc.
11 Dearborn Road
Peabody, MA 01960
(978) 535-5900
Request Product Info
Login / My Account
Login / My Account
© Copyright 2024 by JEOL USA, Inc.
<
Contact your local
Sales Representative
to schedule a
virtual demo now (USA, Canada, Mexico, Brazil)
Find your local
Service Office
Need
Training
on your instrument?
Terms of Use
|
Privacy Policy
|
Cookie Preferences