Electron Optic Documents

The applications for lithium ion batteries (LIB) cover a wide range, from power sources for personal computers and mobile devices to automobiles, and there is always a demand for even better performance and safety. In order to ensure the performance and quality of LIB, analysis and evaluation using high-performance assessment systems is necessary. JEOL offers a full line-up of equipment to support the development of new LIB technologies and to improve product quality, including instruments for morphology observation and surface analysis, chemical analysis systems to perform structural analysis on a molecular level, as well as fabrication systems to create high-performance coatings and powders. This LIB note offers solutions for researchers and engineers who are looking for the best equipment for their application.

The SHL is a newly designed objective lens for high-resolution observation at low accelerating voltages. Unlike the semi-in lens SEM, with a large electromagnetic field below the lens, which was widely used for high-resolution, low kV observation, the SHL achieves high resolution by superimposing a magnetic field onto the electrostatic field to suppress magnetic field leakage. Therefore, the SHL is suitable for the high resolution observation of magnetic materials and electron backscattered diffraction (EBSD) even at short WD, which were difficult with the semi-in lens type SEMs. The SHL type SEM can also be configured for low vacuum operation while the semi-in lens type cannot.

STEM-in-SEM (Scanning Transmission Electron Microscopy in an SEM) has become a popular technique for biologists, polymer scientists and materials scientists for its ease of use, cost effectiveness and high resolution. It is especially suited to investigation of the internal structure of thin film (50-100nm) samples as well as size and shape of submicron to nanometer particles. With standard SEM imaging modes and EDS analysis on bulk samples, there are limitations in the ultimate resolution that can be achieved due in part to the beam-sample interactions. With STEM-in-SEM, the sample is very thin and the interaction volume is greatly reduced, which allows for sub-nanometer resolution and nanoscale analysis. One of the main challenges to EDS analysis using STEM-in-SEM is how to reduce the hard X-ray contribution from the detector and chamber (generally peaks from Al and Si). JEOL has designed a dedicated Analytical holder with a carbon retainer that greatly reduces these spurious peaks allowing for more accurate analytical data.

The ability to increase the probe current for fast microanalysis, while still maintaining a small spot size and small volume of excitation for high resolution, has been the holy grail of microanalysis in SEM. One of the unique features of JEOL’s FE SEMs is the patented Aperture Angle Control Lens (ACL). This lens automatically optimizes for both high resolution imaging at low probe currents and high spatial resolution X-ray analysis at high probe currents with a seamless transition between the two. This is essential for rapid analysis and superb image quality and is particularly true for low kV microanalysis. The ACL works by considering effects of all aberrations (spherical, chromatic and diffraction limitations) on spot size and automatically optimizing the convergence angle.

JEOL’s Particle Analysis Software 3 (PA3) enhances the capability of your analytical SEM by automating the detection, EDS analysis and classification of particles, grains or other features in your samples. Fully integrated with our SEM-EDS systems, PA3 increases throughput and productivity by providing fast, unattended measurements across large areas of a sample, or multiple samples.

Phase Analysis provides a new level of automation to your JEOL EDS data analysis and interpretation workflows

The first commercially available SEM was introduced over 50 years ago and to this day there is still no internationally accepted standard for determining SEM resolution. To add to the confusion, each SEM manufacturer relies on their own sample and methods for determining resolution.

The first commercially available SEM was introduced over 50 years ago and to this day there is still no internationally accepted standard procedure for determining the resolution in an SEM image. To add to the confusion, each SEM manufacturer relies on their own sample and methods for determining resolution. Defining the edge of a particle manually is also always subjective in nature; values will differ from one person to the next based on how that person interprets or ‘sees’ the edge of a particle.

SEM is an indispensable tool for studying the microstructure of a wide variety of materials. The images generated are inherently a 2 dimensional representation of the sample surface. Unlocking the 3rd dimension by reconstructing a 3D model from multiple SEM images can enhance our understanding of complex microstructure. This 3D view is often more intuitive and surface metrology characteristics can be calculated.

What makes the difference between a good SEM image and a stellar one? Imaging samples at the appropriate conditions, and that often means at very low accelerating voltage (low kV). It's time to give it a try! Every modern day scanning electron microscope (SEM) from the top of the line, ultra-high resolution field emission SEMs to the most economical entry level bench-top tungsten (W) thermionic SEMs have the capability of imaging samples at very low accelerating voltage (Low kV ). Low kV imaging has many benefits and this easily accessible function should not be overlooked.