Electron Optic Documents

An e-ABF is observable as a "live image" with real-time signal processing of ABF and BF signals and it shows enhanced contrast of light atoms.

In recent years with the advances in both EBSD and FE-SEM technology there have been renewed efforts at analyzing nanostructured materials at high temperatures using dedicated specimen holders and sub-stages. Although the techniques for EBSD analysis of bulk materials using heating stages have been well established [1], the requirements for nanostructured materials preparation and analysis obviously differs from bulk materials and can benefit from a miniaturized heater with smaller sample/higher temperature capacity capability [2].

The Electrostatic Dose Modulator (EDM) is a fast beam blanking system with a pre-sample electrostatic deflector that includes electronics and software control. With EDM, the beam can switch on or off in less than 50 ns. This 100,000x improvement in blanking speed results in immediate enhancement in the clarity of data taken at fast exposure times. Moreover, EDM includes a desktop control knob that allows users to easily attenuate electron dose without affecting imaging conditions. The included software interface gives TEM and STEM users direct access to EDM’s pulse width modulation parameters providing exceptional control over the dose rate on their samples – invaluable feature for beam sensitive specimen imaging and analysis.

Electron Backscatter Diffraction (EBSD) is a powerful technique capable of characterizing extremely fine grained microstructures in a Scanning Electron Microscope (SEM). Electron Backscatter Patterns (EBSPs) are generated near the sample surface, typically from a depth in the range 10 – 50nm. In order to achieve effective analysis it is imperative to combine high beam current with small probe size to achieve high spatial resolution in a time efficient manner.

Utilizing Monte Carlo Modeling of electron trajectories Electron Flight Simulator is a software tool designed to make your job easier. It can help you understand difficult samples, show the best way to run an analysis, and help explain results to others. With it you can see how the electron beam penetrates your sample, and where the X-ray signal comes from, for a wide variety of microscope conditions. You can model multiple layers, particles, defects, inclusions, and cross-sections. Any sample chemistry can be modeled.

JEOL’s in column Upper Electron Detector (Through The Lens Detector) provides not only ultra-high resolution imaging but also includes a user selectable energy filter allowing the user to study a sample under different contrast mechanisms. For example, this energy filter allows the user to select low energy secondary electrons (SE) to enhance topographic features or high energy backscatter electrons (BSE) to highlight atomic number contrast. This detector is especially useful at lower kVs.

The JEOL Environmental Airlock system allows for the simple transfer of reactive specimens to the SEM without being exposed to air. For specimens where any exposure to air or moisture can alter or destroy the structure, this system provides a cost effective and simple method to bring specimens from a glove box directly to the SEM.

In the last decade there has been a quantum leap in the ability of scanning electron microscopes to observe a variety of materials and biological specimens with ultrahigh resolution and exceptional surface detail, in particular employing low voltage SEM. Low voltage imaging has become a key technique for charge control and reduction, especially in the cases where no surface modification (for example conductive coating) can be employed to alleviate specimen charging during SEM observation.

The F2 is a new concept of 20-200kV TEM equipped with a Cold FEG. This new generation of multi-purpose electron microscope is designed specifically to meet today’s diversified needs. Transmission electron microscopy gives access to two-dimensional information coming from the sample. The third dimension is available thanks to the tomography technique. The sample is tilted and for each step, an image (TEM, STEM, EDS) is acquired. Then the 3D volume of the sample can be reconstructed. The F2 has a “Dual SDD system”, which is composed of two silicon drift detectors (SDD) with large sensor areas, resulting in a total solid angle of 1.7 sr. The combination of two detectors and their placement around the sample, allows the ability to record EDS information throughout the full tilt series (from -80° to +80°).

The F2 is a new concept of 20-200kV TEM equipped with a Cold FEG. This new generation of multi-purpose electron microscope is designed specifically to meet today’s diversified needs. Thanks to the high brightness and small probe size of the Cold FEG, the F2 is able to reach an unprecedented guaranteed resolution for STEM (0.14nm), EDS (1.7sr) and EELS (0.3eV) at the same time, creating a new class of high-end non-corrected TEM.