Electron Optic Documents

The combination of Scanning electron microscope (SEM) imaging and embedded microanalysis (EDS) offers the perfect combination of direct particle visualization and chemical information at the same time. The recent emergence of automated solutions and multi area analyses has brought this technique to the forefront of the available automated particle analysis solutions.

For people who are using the SEM for the first time. Includes topics such as What is the SEM, Observation  Examples, Specimen Preparation and Observation Technique, Functions of SEM's Individual Components, New Functions of SEM, Comparison of Scanning Electron Microscope with Optical Microscope and Transmission Electron Microscope, and Description of Terms.

SEM is a natural extension to viewing specimens with an optical microscope due in part to its inherent higher depth of field and ability to resolve smaller microstructures. Creating a 3-dimensional (3D) surface model can further enhance our understanding with specimens that have complex topographical features.

Auto tuning of aberration corrector

The field of single particle structure analysis (SPA) by cryo-electron microscopy reached new highs with the publication of a 1.19Å structure of apo-ferritin by Maki-Yonekura et al. obtained using a JEOL CRYO ARM™ 300 model 33001. This electron cryo-microscope was specifically designed for highly automated workflows capable of the unattended acquisition thousands of images of vitrified specimens. Workflow support of the JEOL CRYO ARM™ is available for SPA, batch tomography and microED.

Determining the near-atomic resolution structure of a biological macromolecule requires time on a high-end electron cryo-microscope. Depending on the local situation this could mean acquiring images of frozen-hydrated specimens on a JEOL CRYO ARM™ and/or another cryo microscope. To optimize inter-operability between different brands of cryo-microscopes, JEOL have investigated two related aspects: a) the reverse transfer, that is extracting frozen-hydrated specimens from one microscope to be transferred to another one, and b) the usability of a special cartridge designated as AG that are AutoGrid compatible.

JEOL SEMs are delivered with the capability for remote viewing and remote operation. The SEM computer includes a 2nd ethernet card for connection to your local area network. There is no need for a second support computer. Just connect your JEOL SEM computer to a reliable and fast broadband internet connection and choose the software platform that meets your remote access requirements.

JSM-IT700HR Product Brochure

JSM-IT800HL Brochure

JEOL’s large chamber SEMs are designed for easy access in both the Tungsten SEM and Thermal Schottky Field Emission SEM models. Our large, direct-access sample chambers are ideal suited for the labs that require high-throughput and multi-sample imaging and analysis, multiple ports to fit a variety of accessories, and analysis of large samples that cannot be cut to size.