Electron Optic Documents

JEOL Resources

rss

Documents of interest in support of your JEOL product

Chemical state analysis of Li and Si for Si negative electrode of solid-state lithium ion battery, using combination of windowless EDS and SXES on a SEM

Silicon (Si) negative electrode material has problems such as volume expansion and decrease of charging efficiency during charging-discharging, but it has a large theoretical capacitance of 4200 mAh/g and is attracting attention as a new material for Lithium (Li) ion secondary battery (LIB) to replace graphite which is widely used. Therefore, a chemical state analysis method using soft X-ray emission spectroscopy (SXES) has been reported for the purpose of structural analysis of the Si negative electrode active material in the charged state. However, since elemental mapping by SXES takes at least a few hours of processing time, it is not easy to compare the chemical state of each Si particle across the entire negative electrode layer. In this study, we combined a newly designed windowless EDS and SXES, and tried to establish a simple method to analyze the chemical state of Si negative electrodes in charged states.

The Schottky FE-SEM, JSM-IT800 (JEOL), combined with the SXES-LR, SS-94000SXES (JEOL), and the windowless EDS, Dry SDTM Gather-X (JEOL), was used for this study.

Attached Files
Showing 0 Comment


Comments are closed.

Other Resources

  • Image Gallery
    View a selection of electron images
  • FAQs
    See answers from questions often asked about our SEM and Surface Analysis instruments
  • Links & Resources
    View our page of useful and interesting links to various electron microscopy resources
  • Videos
    View some product presentations of our instruments
  • SEM Theory and SEM Training
    Learn about basic theory, physical operation, and practical applications for SEM
    Basics of SEM
    Learn about the basics of scanning electron microscopy
    JEOLink Newsletter
    Several times a year, we publish and send out a newsletter to our customers. They can also be viewed here
    © Copyright 2024 by JEOL USA, Inc.
    Terms of Use
    |
    Privacy Policy
    |
    Cookie Preferences