CLEMnote: Correlative Light and Electron Microscopy
CLEM is an acronym for Correlative Light and Electron Microscopy. It is one of the most effective analysis methods that provides a synergetic effect by combining the capabilities of the Light Microscope (LM), Transmission Electron Microscope (TEM) and Scanning Electron Microscope (SEM) in observing the same specimen.
In order to realize CLEM, it is important to develop the nest workflow for each specimen and purpose. At the "JEOL-Nikon CLEM Solution Center," JEOL Ltd. and NIKON CORPORATION have provided customers' solutions through observations and analyses of various types of specimens.