SEM - 3D Surface Reconstruction
SEM is an indispensable tool for studying the microstructure of a wide variety of materials. The images generated are inherently a 2 dimensional representation of the sample surface. Unlocking the 3rd dimension by reconstructing a 3D model from multiple SEM images can enhance our understanding of complex microstructure. This 3D view is often more intuitive and surface metrology characteristics can be calculated.
The table below highlights two common software options for 3D Surface Reconstruction in SEM offered by JEOL.
| |
3D Sight
P/N: MP-45030TDI |
Smile View™ Map
P/N: DS-JE-SVM |
| Constructs 3D model from |
2 Images |
1, 2 or 4 Images |
| 3D Color Intensity Maps |
✓ |
✓ |
| Anaglyph Image |
✓ |
✓ |
| Height Profile and measurement |
✓ |
✓ |
| Image Calibration |
|
✓ |
| Image Enhancement & Correction |
|
✓ |
| Geometric Analysis |
|
✓ |
| Surface Texture Analysis |
|
✓ |
| Colorization |
|
✓ |
| Colocalization (Correlation) |
|
✓ |
Optional Modules:
- Particle Analysis
- Advanced Topography
- Advanced Profile
- Fourier and Wavelets
|
|
✓ |