The Gather-X windowless energy-dispersive (EDS) detector is ideal for higher sensitivity analyses, higher spatial resolution mapping, and the detection of lower energy X-rays down to Li. This detector is fully integrated and embedded within the JEOL FESEM software interface, providing safe operation and high sensitivity at the short working distances required for achieving ultra-high spatial resolution. It enables higher count rates allowing for fast collection times, minimizing potential beam damage with sensitive specimens. Higher throughput is achieved with EDS analysis completed at the same conditions used for high-resolution imaging (low accelerating voltage, low probe current, and short working distance). This innovative technology enables collection of the entire range of X-rays using electron beam voltages up to 30kV, with improved detection sensitivity for characteristic X-rays less than 1 keV and the ability to detect soft X-ray regions less than 100eV. In this webinar, the benefits of this detector will be demonstrated through a variety of examples of nanostructures from several types of nanoscale devices. Examples include semiconductor devices, nanoparticles, and a lithium metal anode cross section prepared with a broad argon ion beam and using an air-isolated workflow.